Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron X-ray

Applied Surface Science

Volumn 223, Issue 1-3, 2004, Pages 175-182

  Chu, Yong S ^a   Tkachuk, Andrei ^a   Vogt, Stefan ^a   Ilinski, Petr ^a   Walko, Donald A ^a   Mancini, Derrick C ^a   Dufresne, Eric M ^b   He, Liang ^c   Tsui, Frank ^c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c UNIVERSITY OF NORTH CAROLINA   (United States)

Author keywords

CoMnGe; Composition spread; Phase diagram; X ray diffraction

Indexed keywords

BINARY MIXTURES; COBALT COMPOUNDS; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; PHASE DIAGRAMS; SYNCHROTRONS; SYNTHESIS (CHEMICAL); TERNARY SYSTEMS; THROUGHPUT; X RAY DIFFRACTION;

FLUX DENSITY; STRUCTURAL PHASE MAPPING;

THIN FILMS;

EID: 0346934864     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00894-8     Document Type: Article

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