Rapid structural mapping of ternary metallic alloy systems using the combinatorial approach and cluster analysis

Review of Scientific Instruments

Volumn 78, Issue 7, 2007, Pages

  Long, C J ^b   Hattrick Simpers, J ^b   Murakami, M ^b   Srivastava, R C ^b   Takeuchi, I ^b   Karen, V L ^a   Li, X ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

IN-HOUSE SCANNING; SHORTER ANALYSIS; STRUCTURAL PHASES;

CLUSTER ANALYSIS; DATABASE SYSTEMS; MICROSTRUCTURE; PHASE DIAGRAMS;

TERNARY ALLOYS;

ALLOY; METAL;

ALGORITHM; ARTICLE; CHEMISTRY; CLUSTER ANALYSIS; COMBINATORIAL CHEMISTRY; EVALUATION; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; X RAY DIFFRACTION;

ALGORITHMS; ALLOYS; CLUSTER ANALYSIS; COMBINATORIAL CHEMISTRY TECHNIQUES; MATERIALS TESTING; METALS; X-RAY DIFFRACTION;

EID: 34547561033     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2755487     Document Type: Article

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