High-throughput screening of combinatorial materials libraries by high-energy x-ray diffraction

Applied Physics Letters

Volumn 91, Issue 7, 2007, Pages

  Kukuruznyak, Dmitry A ^a   Reichert, Harald ^a   Okasinski, John ^a   Dosch, Helmut ^a   Chikyow, Toyohiro ^b   Daniels, John ^c   Honkimäki, Veijo ^c  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DIFFRACTION PATTERNS; POLYCRYSTALLINE MATERIALS; X RAY DIFFRACTION;

POLYCRYSTALLINE SPREADS; TERNARY OXIDE SYSTEM; X-RAY BEAMS;

THIN FILMS;

EID: 34548044250     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2771539     Document Type: Article

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