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Volumn 48, Issue 11, 2009, Pages

Oxygen stability and leakage current properties of La-modified bismuth titanate ferroelectric thin films

(9) Shin, Ran Hee a Lee, Ji Hye a Kim, Gracia a Jo, William a Kwon, O Jong b Park, Chan b Kim, Dae Hyun c Lee, Hyun Jin c Kang, Jeongsoo c

a Ewha Womans University (South Korea)

b Seoul National University (South Korea)

c The Catholic University of Korea (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC CONDITIONS; BISMUTH TITANATE; BOUND CHARGE; OXYGEN ANNEALING; SCANNING PROBES; SCHOTTKY; X-RAY PHOTOEMISSION SPECTRA;

BISMUTH; DIFFRACTION; EMISSION SPECTROSCOPY; FERROELECTRIC FILMS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; HOLOGRAPHIC INTERFEROMETRY; LEAKAGE CURRENTS; OXYGEN; THERMIONIC EMISSION;

LEAKAGE (FLUID);

EID: 73849094833 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.48.111407 Document Type: Article

Times cited : (2)

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