Ferroelectric properties and leakage current characteristics of Bi 3.25 La 0.75 Ti 3O 12 thin films prepared by the polymeric precursor method

Journal of Applied Physics

Volumn 98, Issue 11, 2005, Pages

  Simes A Z ^a   Ramirez M A ^a   Riccardi, C S ^a   Longo, E ^a   Varela, J A ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

DOMAIN WALLS; FERROELECTRIC PROPERTIES; POLYMERIC PRECURSOR METHOD;

CRYSTAL MICROSTRUCTURE; LEAKAGE CURRENTS; MAGNETIC DOMAINS; MORPHOLOGY; POLARIZATION; REMANENCE; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION;

FERROELECTRICITY;

EID: 29144504015     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2133902     Document Type: Article

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