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Volumn 518, Issue 6 SUPPL. 1, 2010, Pages
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Al-induced low-temperature crystallization of Si1 - xGex (0 < x < 1) by controlling layer exchange process
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Author keywords
Al induced crystallization; SiGe; System in display; Thin film solar cell
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Indexed keywords
AL OXIDE;
GE FRACTION;
HIGH EFFICIENCY;
INDUCED CRYSTALLIZATION;
INSULATING FILM;
LARGE-GRAIN;
LAYER EXCHANGE;
LOW TEMPERATURES;
LOW-TEMPERATURE CRYSTALLIZATION;
OXIDE LAYER THICKNESS;
POLY-SIGE;
STACKED STRUCTURE;
THIN-FILM SOLAR CELLS;
CRYSTALLIZATION;
GERMANIUM;
GRAIN BOUNDARIES;
INSULATION;
POLYSILICON;
PROCESS CONTROL;
SILICON ALLOYS;
SOLAR CELLS;
THIN FILM DEVICES;
ALUMINUM;
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EID: 73649129223
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2009.10.082 Document Type: Article |
Times cited : (9)
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References (22)
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