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Volumn 23, Issue 2-4, 2009, Pages 548-553

Effect of a hydrogen ratio in electrical and optical properties of hydrogenated Al-doped ZnO films

Author keywords

Al doping; Hydrogenated; Rf magnetron sputtering; ZnO

Indexed keywords

AL-DOPED ZINC OXIDE; AL-DOPED ZNO; AL-DOPING; AZO FILMS; AZO THIN FILMS; CERAMIC TARGET; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL PROPERTY; FLOW RATIOS; HYDROGEN RATIO; OPTICAL TRANSMISSIONS; RF-MAGNETRON SPUTTERING; ROOM TEMPERATURE; VISIBLE RANGE; ZNO;

EID: 73449144799     PISSN: 13853449     EISSN: 15738663     Source Type: Journal    
DOI: 10.1007/s10832-008-9532-0     Document Type: Article
Times cited : (44)

References (20)
  • 1
    • 12244311918 scopus 로고    scopus 로고
    • Properties of transparent conductive ZnO:Al films prepared by co-sputtering
    • DOI 10.1016/j.jcrysgro.2004.10.026, PII S0022024804012849
    • B.Y. Oh M.C. Jeong W. Lee J.M. Myoung 2005 J. Cryst. Growth 274 453 10.1016/j.jcrysgro.2004.10.026 1:CAS:528:DC%2BD2MXmtFyhsQ%3D%3D 2005JCrGr.274..453O (Pubitemid 40114388)
    • (2005) Journal of Crystal Growth , vol.274 , Issue.3-4 , pp. 453-457
    • Oh, B.-Y.1    Jeong, M.-C.2    Lee, W.3    Myoung, J.-M.4
  • 2
    • 0035881692 scopus 로고    scopus 로고
    • 10.1016/S0040-6090(01)01167-1 1:CAS:528:DC%2BD3MXmtFaiur4%3D
    • A. Nuruddin J.R. Abelson 2001 Thin Solid Films 394 49 10.1016/S0040-6090(01)01167-1 1:CAS:528:DC%2BD3MXmtFaiur4%3D
    • (2001) Thin Solid Films , vol.394 , pp. 49
    • Nuruddin, A.1    Abelson, J.R.2
  • 3
    • 0038136910 scopus 로고    scopus 로고
    • Transparent electronics
    • DOI 10.1126/science.1085276
    • J.F. Wager 2003 Science 300 1245 10.1126/science.1085276 1:CAS:528:DC%2BD3sXlt1Sjsr8%3D 12764184 (Pubitemid 36618226)
    • (2003) Science , vol.300 , Issue.5623 , pp. 1245-1246
    • Wager, J.F.1
  • 5
    • 0000170470 scopus 로고    scopus 로고
    • 10.1063/1.366092 1:CAS:528:DyaK2sXlsl2qt7Y%3D 1997JAP.82.2115W
    • W. Wendt K. Ellmer K. Wiesemann 1997 J. Appl. Phys 82 2115 10.1063/1.366092 1:CAS:528:DyaK2sXlsl2qt7Y%3D 1997JAP....82.2115W
    • (1997) J. Appl. Phys , vol.82 , pp. 2115
    • Wendt, W.1    Ellmer, K.2    Wiesemann, K.3
  • 6
    • 33847226669 scopus 로고    scopus 로고
    • 2/Ar gas flow ratio on the electrical and transmittance properties of ZnO:Al films deposited by RF magnetron sputtering
    • DOI 10.1007/s10832-006-7036-3, Special Issue: ICE-2005 International Conference on Electroceramics
    • K. Yim H. Kim C. Lee 2006 J. Electroceram 17 875 10.1007/s10832-006-7036- 3 1:CAS:528:DC%2BD2sXns1amsg%3D%3D (Pubitemid 46307075)
    • (2006) Journal of Electroceramics , vol.17 , Issue.2-4 , pp. 875-877
    • Yim, K.1    Kim, H.2    Lee, C.3
  • 7
    • 36449004461 scopus 로고
    • 10.1063/1.348748 1:CAS:528:DyaK3MXhslGlurg%3D 1991JAP.69.2190I
    • Y. Igasaki H. Saito 1991 J. Appl. Phys 69 2190 10.1063/1.348748 1:CAS:528:DyaK3MXhslGlurg%3D 1991JAP....69.2190I
    • (1991) J. Appl. Phys , vol.69 , pp. 2190
    • Igasaki, Y.1    Saito, H.2
  • 8
    • 0033900437 scopus 로고    scopus 로고
    • Influence of oxygen partial pressure on transparency and conductivity of RF sputtered Al-doped ZnO thin films
    • DOI 10.1016/S0169-4332(99)00517-6
    • T. Tsuji M. Hirohashi 2000 Appl. Surf. Sci 157 47 10.1016/S0169-4332(99) 00517-6 1:CAS:528:DC%2BD3cXit1ektLw%3D 2000ApSS..157...47T (Pubitemid 30565696)
    • (2000) Applied Surface Science , vol.157 , Issue.1 , pp. 47-51
    • Tsuji, T.1    Hirohashi, M.2
  • 9
    • 0000343622 scopus 로고    scopus 로고
    • 10.1063/1.372194 1:CAS:528:DC%2BD3cXhtlSks7k%3D 2000JAP.87.2413S
    • S.A. Studenikin N. Golego M. Cocivera 2000 J. Appl. Phys 87 2413 10.1063/1.372194 1:CAS:528:DC%2BD3cXhtlSks7k%3D 2000JAP....87.2413S
    • (2000) J. Appl. Phys , vol.87 , pp. 2413
    • Studenikin, S.A.1    Golego, N.2    Cocivera, M.3
  • 10
    • 0035851256 scopus 로고    scopus 로고
    • Effects of post-annealing on the structure and properties of Al-doped zinc oxide films
    • DOI 10.1016/S0169-4332(01)00541-4, PII S0169433201005414
    • J.F. Chang W.C. Lin M.H. Hon 2001 Appl. Surf. Sci 183 18 10.1016/S0169-4332(01)00541-4 1:CAS:528:DC%2BD3MXotF2lurc%3D 2001ApSS..183...18C (Pubitemid 33039299)
    • (2001) Applied Surface Science , vol.183 , Issue.1-2 , pp. 18-25
    • Chang, J.F.1    Lin, W.C.2    Hon, M.H.3
  • 11
    • 18244430368 scopus 로고    scopus 로고
    • Hydrogen as a cause of doping in zinc oxide
    • DOI 10.1103/PhysRevLett.85.1012
    • C.G. Van de Walle 2000 Phys. Rev. Lett. 85 1012 10.1103/PhysRevLett.85. 1012 2000PhRvL..85.1012V (Pubitemid 30901766)
    • (2000) Physical Review Letters , vol.85 , Issue.5 , pp. 1012-1015
    • Van De Walle, C.G.1
  • 12
    • 1842527583 scopus 로고    scopus 로고
    • 10.1016/j.apsusc.2003.10.040 1:CAS:528:DC%2BD2cXislynu78%3D 2004ApSS.226.378H
    • R.J. Hong K. Helming X. Jiang B. Szyszka 2004 Appl. Surf. Sci. 226 378 10.1016/j.apsusc.2003.10.040 1:CAS:528:DC%2BD2cXislynu78%3D 2004ApSS..226..378H
    • (2004) Appl. Surf. Sci. , vol.226 , pp. 378
    • Hong, R.J.1    Helming, K.2    Jiang, X.3    Szyszka, B.4
  • 13
    • 36549094294 scopus 로고
    • 10.1063/1.342419 1:CAS:528:DyaL1MXkslGhsQ%3D%3D 1988JAP.64.5117J
    • Z.C. Jin I. Hamberg 1988 J. Appl. Phys 64 5117 10.1063/1.342419 1:CAS:528:DyaL1MXkslGhsQ%3D%3D 1988JAP....64.5117J
    • (1988) J. Appl. Phys , vol.64 , pp. 5117
    • Jin, Z.C.1    Hamberg, I.2
  • 14
    • 0025493712 scopus 로고
    • 10.1016/0040-6090(89)90918-8 1:CAS:528:DyaK3cXmsVagsLY%3D
    • G. Sanon R. Rip A. Mansingh 1990 Thin Solid Films 190 287 10.1016/0040-6090(89)90918-8 1:CAS:528:DyaK3cXmsVagsLY%3D
    • (1990) Thin Solid Films , vol.190 , pp. 287
    • Sanon, G.1    Rip, R.2    Mansingh, A.3
  • 15
    • 0001252988 scopus 로고    scopus 로고
    • 10.1116/1.581902 1:CAS:528:DyaK1MXktFygs7k%3D 1999JVST.17.1843Z
    • K. Zhang A.R. Forouhi I. Bloomer 1999 J. Vac. Sci. Technol. A 17 1843 10.1116/1.581902 1:CAS:528:DyaK1MXktFygs7k%3D 1999JVST...17.1843Z
    • (1999) J. Vac. Sci. Technol. A , vol.17 , pp. 1843
    • Zhang, K.1    Forouhi, A.R.2    Bloomer, I.3


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