High performance Schottky UV photodetectors based on epitaxial AlGaN thin film

Physica B: Condensed Matter

Volumn 405, Issue 3, 2010, Pages 996-998

  Li, J ^a   Zhao, M ^b   Wang, X F ^a  

^a Jilin Institute of Metrology Technology   (China)

^b AVIATION UNIVERSITY OF AIR FORCE   (China)

Author keywords

Algan; MSM; Schottky

Indexed keywords

ALGAN; DETECTIVITY; METALORGANIC CHEMICAL VAPOR DEPOSITION; ORDERS OF MAGNITUDE; PEAK RESPONSIVITY; PLANAR GEOMETRIES; SCHOTTKY; ULTRA-VIOLET; UV PHOTODETECTORS;

ALUMINUM; EPITAXIAL LAYERS; GALLIUM; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTOELECTRONIC DEVICES; ORGANIC CHEMICALS; ORGANOMETALLICS;

PHOTODETECTORS;

EID: 72649083150     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2009.10.040     Document Type: Article

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