|
Volumn , Issue , 2009, Pages 268-271
|
Temperature-insensitive silicon carbide resonant micro-extensometers
|
Author keywords
Gage; Gauge; Resonant; Resonator; SiC; Silicon carbide; Strain; Temperature compensation
|
Indexed keywords
ANALYTICAL MODEL;
DEVICE LAYERS;
EPITAXIAL SILICON;
GAUGE;
MATERIAL SOFTENING;
NEAR ROOM TEMPERATURE;
POLYCRYSTALLINE SILICON CARBIDE;
SINGLE CRYSTALLINE SILICON;
STRAIN SENSING;
STRAIN TEMPERATURE;
TEMPERATURE SENSITIVITY;
TEMPERATURE-INSENSITIVE;
THERMAL EXPANSION COEFFICIENTS;
TURNOVER TEMPERATURES;
ACTUATORS;
DILATOMETERS;
GAGES;
MICROSYSTEMS;
PIEZOELECTRIC TRANSDUCERS;
POLYCRYSTALLINE MATERIALS;
POLYSILICON;
RESONATORS;
SILICON CARBIDE;
SOLID-STATE SENSORS;
TEMPERATURE DISTRIBUTION;
TENSILE STRAIN;
THERMAL EXPANSION;
SEMICONDUCTING SILICON COMPOUNDS;
|
EID: 71449103481
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SENSOR.2009.5285513 Document Type: Conference Paper |
Times cited : (5)
|
References (11)
|