Normal and lateral modulation with a scanning force microscope, an analysis: Implication in quantitative elastic and friction imaging

Tribology Letters

Volumn 7, Issue 4, 1999, Pages 199-212

  Mazeran, Pierre Emmanuel ^a   Loubet, Jean Luc ^a  

^a LABORATOIRE DE TRIBOLOGIE ET DYNAMIQUE DES SYSTÈMES   (France)

Author keywords

Contact stiffness; Elasticity; Force modulation; Friction; Lateral force microscope; Modeling; Normal and lateral modulation; Scanning force microscope; Shear modulus; Young modulus

Indexed keywords

EID: 0000264647     PISSN: 10238883     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1019142025011     Document Type: Article

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