Characterization and modelling of the elastic properties of nano-structured W/Cu multilayers

Thin Solid Films

Volumn 516, Issue 2-4, 2007, Pages 320-324

  Castelnau, O ^a   Geandier, G ^b   Renault, P O ^b   Goudeau, Ph ^b   Le Bourhis, E ^b  

^a UNIVERSITÉ PARIS 13   (France)

^b UNIVERSITÉ DE POITIERS   (France)

Author keywords

Elastic anisotropy; Micromechanics; Nanostructure; Synchrotron radiation; Thin films; X ray diffraction

Indexed keywords

GRAIN SIZE AND SHAPE; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; POLYIMIDES; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

ELASTIC ANISOTROPY; ELASTIC PROPERTIES; TECHNOLOGICAL APPLICATIONS;

MULTILAYERS;

EID: 36048950709     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.06.132     Document Type: Article

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