Imaging defects and junctions in single-walled carbon nanotubes by voltage-contrast scanning electron microscopy

Carbon

Volumn 48, Issue 2, 2010, Pages 494-500

  Vijayaraghavan, Aravind ^a   Marquardt, Christoph W ^a   Dehm, Simone ^a   Hennrich, Frank ^a   Krupke, Ralph ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT HEALING; DEVICE CONFIGURATIONS; ELECTRICAL BREAKDOWN; ELECTRONIC DEFECTS; HIGH-CURRENT; IMAGING CONDITIONS; IN-SITU CHARACTERIZATION; NANO SCALE; NANOTUBE DEVICES; NANOTUBE GROWTH; STRUCTURAL POINT;

DEFECTS; METAL INSULATOR BOUNDARIES; METAL INSULATOR TRANSITION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR INSULATOR BOUNDARIES; SINGLE-WALLED CARBON NANOTUBES (SWCN); SURFACE DEFECTS;

CARBON NANOTUBES;

EID: 70449528638     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2009.09.067     Document Type: Article

References (39)

1. Saito R., Fujita M., Dresselhaus G., and Dresselhaus M.S. Electronic-structure of graphene tubules based on C-60. Phys Rev B 46 (1992) 1804-1811
2. McEuen P.L. Single-wall carbon nanotubes. Phys World 13 (2000) 31-36
3. Charlier J.C. Defects in carbon nanotubes. Acc Chem Res 35 (2002) 1063-1069
4. Zhang J., Zou H., Qing Q., Yang Y., Li Q., Liu Z., et al. Effect of chemical oxidation on the structure of single-walled carbon nanotubes. J Phys Chem B 107 (2003) 3712-3718
5. Hennrich F., Krupke R., Arnold K., RojasStutz J.A., Lebedkin S., Koch T., et al. The mechanism of cavitation-induced scission of single-walled carbon nanotubes. J Phys Chem B 111 (2007) 1932-1937
6. Lu K.L., Lago R.M., Chen Y.K., Green M.L.H., Harris P.J.F., and Tsang S.C. Mechanical damage of carbon nanotubes by ultrasound. Carbon 34 (1996) 814-816
7. Krasheninnikov AV, Nordlund K, Sirviö M, Salonen E, Keinonen J. Formation of ion-irradiation-induced atomic-scale defects on walls of carbon nanotubes. Phys Rev B 2001;63:245405-1-6.
8. Smith B.W., and Luzzi D.E. Electron irradiation effects in single wall carbon nanotubes. J Appl Phys 90 (2001) 3509-3515
9. Ajayan P.M., Ravikumar V., and Charlier J.C. Surface reconstructions and dimensional changes in single-walled carbon nanotubes. Phys Rev Lett 81 (1998) 1437-1440
10. Javey A, Guo J, Paulsson M, Wang Q, Mann D, Lundstrom M, et al. High-field quasiballistic transport in short carbon nanotubes. Phys Rev Lett 2004;92:106804-1-4.
11. Vijayaraghavan A., Kanzaki K., Suzuki S., Kobayashi Y., Inokawa H., Ono Y., et al. Metal-semiconductor transition in single-walled carbon nanotubes induced by low-energy electron irradiation. Nano Lett 5 (2005) 1575-1579
12. Marquardt C.W., Dehm S., Vijayaraghavan A., Blatt S., Hennrich F., and Krupke R. Reversible metal-insulator transitions in metallic single-walled carbon nanotubes. Nano Lett 8 (2008) 2767-2772
13. Vijayaraghavan A., Blatt S., Marquardt C., Dehm S., Wahi R., Hennrich F., et al. Imaging electronic structure of carbon nanotubes by voltage-contrast scanning electron microscopy. Nano Res 1 (2008) 321-332
14. Vijayaraghavan A, Kar S, Soldano C, Talapatra S, Nalamasu O, Ajayan PM. Charge-injection-induced dynamic screening and origin of hysteresis in field-modulated transport in single-wall carbon nanotubes. Appl Phys Lett 2006;89:162108-1-3.
15. Kar S, Vijayaraghavan A, Soldano C, Talapatra S, Vajtai R, Nalamasu O, et al. Quantitative analysis of hysteresis in carbon nanotube field-effect devices. Appl Phys Lett 2006;89:132118-1-3.
16. Kosaka M., Ebbesen T.W., Hiura H., and Tanigaki K. Annealing effect on carbon nanotubes. An Esr study. Chem Phys Lett 233 (1995) 47-51
17. Terrones M., Banhart F., Grobert N., Charlier J.C., Terrones H., and Ajayan P.M. Molecular junctions by joining single-walled carbon nanotubes. Phys Rev Lett 89 (2002) 075505-1-075505-4
18. Seiler H. Secondary electron emission in the scanning electron microscope. J Appl Phys 54 (1983) R1-R18
19. McEuen P.L., Bockrath M., Cobden D.H., Yoon Y.G., and Louie S.G. Disorder, pseudospins, and backscattering in carbon nanotubes. Phys Rev Lett 83 (1999) 5098-5101
20. Andriotis A.N., Menon M., and Froudakis G.E. Various bonding configurations of transition-metal atoms on carbon nanotubes: their effect on contact resistance. Appl Phys Lett 76 (2000) 3890-3892
21. Bockrath M., Liang W., Bozovic D., Hafner J.H., Lieber C.M., Tinkham M., et al. Resonant electron scattering by defects in single-walled carbon nanotubes. Science 291 (2001) 283-285
22. Biswas SK, Schowalter LJ, Jung YJ, Vijayaraghavan A, Ajayan PM, Vajtai R. Room-temperature resonant tunneling of electrons in carbon nanotube junction quantum wells. Appl Phys Lett 2005;86:183101-1-3.
23. Sand Jespersen T., and Nygård J. Probing induced defects in individual carbon nanotubes using electrostatic force microscopy. Appl Phys A: Mater Sci Process 88 (2007) 309-313
24. Ouyang M., Huang J.-L., Cheung C.L., and Lieber C.M. Atomically resolved single-walled carbon nanotube intramolecular junctions. Science 291 (2001) 97-100
25. Kim H, Lee J, Kahng SJ, Son YW, Lee SB, Lee CK, et al. Direct observation of localized defect states in semiconductor nanotube junctions. Phys Rev Lett 2003;90:216107-1-4.
26. Anderson N., Hartschuh A., and Novotny L. Chirality changes in carbon nanotubes studied with near-field Raman spectroscopy. Nano Lett 7 (2007) 577-582
27. Qian H.H., Gokus T., Anderson N., Novotny L., Meixner A.J., and Hartschuh A. Near-field imaging and spectroscopy of electronic states in single-walled carbon nanotubes. Phys Status Solidi B 243 (2006) 3146-3150
28. Hennrich F., Krupke R., Lebedkin S., Arnold K., Fischer R., Resasco D.E., et al. Raman spectroscopy of individual single-walled carbon nanotubes from various sources. J Phys Chem B 109 (2005) 10567-10573
29. Vijayaraghavan A., Blatt S., Weissenberger D., Oron-Carl M., Hennrich F., Gerthsen D., et al. Ultra-large-scale directed assembly of single-walled carbon nanotube devices. Nano Lett 7 (2007) 1556-1560
30. Krupke R., Malik S., Weber H.B., Hampe O., Kappes M.M., and von Lohneysen H. Patterning and visualizing self-assembled monolayers with low-energy electrons. Nano Lett 2 (2002) 1161-1164
31. Yao Z., Postma H.W.C., Balents L., and Dekker C. Carbon nanotube intramolecular junctions. Nature 402 (1999) 273-276
32. Thrower PA. The study of defects in graphite by transmission electron microscopy. In: Walker PL, Jr., editor. Chemistry and physics of carbon, vol. 5. New York: Marcel Dekker; 1969. p. 217-320.
33. Antonov R.D., and Johnson A.T. Subband population in a single-wall carbon nanotube diode. Phys Rev Lett 83 (1999) 3274-3276
34. Qi P., Javey A., Rolandi M., Wang Q., Yenilmez E., and Dai H. Miniature organic transistors with carbon nanotubes as quasi-one-dimensional electrodes. J Am Chem Soc 126 (2004) 11774-11775
35. Pfeiffer H.C., Langner G.O., Stickel W., and Simpson R.A. Contactless electrical testing of large area specimens using electron beams. J Vacuum Sci Technol 19 (1981) 1014-1018
36. Park H., Lim A.K.L., Alivisatos A.P., Park J., and McEuen P.L. Fabrication of metallic electrodes with nanometer separation by electromigration. Appl Phys Lett 75 (1999) 301-303
37. Rotkin S.V., and Hess K. Possibility of a metallic field-effect transistor. Appl Phys Lett 84 (2004) 3139-3141
38. Freitag M, Johnson AT, Kalinin SV, Bonnell DA. Role of single defects in electronic transport through carbon nanotube field-effect transistors. Phys Rev Lett 2002;89:216801-1-4.
39. Umesaka T, Ohnaka H, Ohno Y, Kishimoto S, Maezawa K, Mizutani T. Surface potential measurement of carbon nanotube field-effect transistors using Kelvin probe force microscopy. Jpn J Appl Phys, Part 1 2007;46:2496-500.