Direct observation of localized defect states in semiconductor nanotube junctions

Physical Review Letters

Volumn 90, Issue 21, 2003, Pages 2161071-2161074

  Kim, Hajin ^a   Lee, J ^a   Kahng, S J ^b   Son, Y W ^a   Lee, S B ^a   Lee, C K ^a   Ihm, J ^a   Kuk, Young ^a  

^a Seoul National University   (South Korea)

^b Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL DEFECTS; ELECTRON ENERGY LEVELS; IMAGE ANALYSIS; SURFACES; ULTRAHIGH VACUUM;

LOCALIZED DEFECT STATES;

CARBON NANOTUBES;

EID: 0347940391     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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