SCOPUS 정보 검색 플랫폼

Volumn 88, Issue 2, 2007, Pages 309-313

Probing induced defects in individual carbon nanotubes using electrostatic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRON IRRADIATION; ELECTRONIC PROPERTIES; MICROSCOPIC EXAMINATION; PLASMA ETCHING; SCANNING ELECTRON MICROSCOPY;

ELECTROSTATIC FORCE MICROSCOPY; INSULATING SUBSTRATES; PROBING DEFECTS; STRUCTURAL DEFECTS;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 34250670489 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-007-3927-7 Document Type: Article

Times cited : (15)

References (16)

1
- 23144458263
- M. Biercuk, S. Garaj, N. Mason, J. Chow, C. Marcus, Nano Lett. 5, 1267 (2005)
- (2005) Nano Lett , vol.5 , pp. 1267
- Biercuk, M.¹ Garaj, S.² Mason, N.³ Chow, J.⁴ Marcus, C.⁵

2
- 79956028240
- J. Park, Y. Yaish, M. Brink, S. Rosenblatt, P. Mceuen, Appl. Phys. Lett. 80, 4446 (2002)
- (2002) Appl. Phys. Lett , vol.80 , pp. 4446
- Park, J.¹ Yaish, Y.² Brink, M.³ Rosenblatt, S.⁴ Mceuen, P.⁵

3
- 33748329692
- J. Robinson, E. Snow, S. Badescu, T. Reinecke, F. Perkins, Nano Lett. 6, 1747 (2006)
- (2006) Nano Lett , vol.6 , pp. 1747
- Robinson, J.¹ Snow, E.² Badescu, S.³ Reinecke, T.⁴ Perkins, F.⁵

4
- 5944246146
- Q. Wang, T. Corrigan, J. Dai, R. Chang, A. Krauss, Appl. Phys. Lett. 70, 3308 (1997)
- (1997) Appl. Phys. Lett , vol.70 , pp. 3308
- Wang, Q.¹ Corrigan, T.² Dai, J.³ Chang, R.⁴ Krauss, A.⁵

5
- 79956050660
- C. Zhi, X. Bai, E. Wang, Appl. Phys. Lett. 81, 1690 (2002)
- (2002) Appl. Phys. Lett , vol.81 , pp. 1690
- Zhi, C.¹ Bai, X.² Wang, E.³

6
- 3042568879
- Y. Liu, L. Liu, P. Liu, L. Sheng, S. Fan, Diam. Relat. Mater. 13, 1609 (2004)
- (2004) Diam. Relat. Mater , vol.13 , pp. 1609
- Liu, Y.¹ Liu, L.² Liu, P.³ Sheng, L.⁴ Fan, S.⁵

7
- 20844458385
- M. Zdrojek, T. Melin, C. Boyaval, D. Stievenard, B. Jouault, M. Wozniak, A. Huczko, W. Gebicki, L. Adamowicz, Appl. Phys. Lett. 86, 213114 (2005)
- (2005) Appl. Phys. Lett , vol.86 , pp. 213114
- Zdrojek, M.¹ Melin, T.² Boyaval, C.³ Stievenard, D.⁴ Jouault, B.⁵ Wozniak, M.⁶ Huczko, A.⁷ Gebicki, W.⁸ Adamowicz, L.⁹

8
- 0000988849
- M. Bockrath, N. Markovic, A. Shepard, M. Tinkham, L. Gurevich, L. Kouwenhoven, M. Wu, L. Sohn, Nano Lett. 2, 187 (2002)
- (2002) Nano Lett , vol.2 , pp. 187
- Bockrath, M.¹ Markovic, N.² Shepard, A.³ Tinkham, M.⁴ Gurevich, L.⁵ Kouwenhoven, L.⁶ Wu, M.⁷ Sohn, L.⁸

9
- 2642517734
- C. Stau, A. Johnson, N. Pinto, Nano Lett. 4, 859 (2004)
- (2004) Nano Lett , vol.4 , pp. 859
- Stau, C.¹ Johnson, A.² Pinto, N.³

10
- 19944389554
- J. Heo, M. Bockrath, Nano Lett. 5, 853 (2005)
- (2005) Nano Lett , vol.5 , pp. 853
- Heo, J.¹ Bockrath, M.²

11
- 0034819152
- J. Hafner, C. Cheung, T. Oosterkamp, C. Lieber, J. Phys. Chem. B 105, 743 (2001)
- (2001) J. Phys. Chem. B , vol.105 , pp. 743
- Hafner, J.¹ Cheung, C.² Oosterkamp, T.³ Lieber, C.⁴

12
- 2342503419
- Wiley-VCH, New York
- S. Reich, C. Thomson, J. Maultzsch, Carbon Nanotubes: Basic Concepts and Physical Properties (Wiley-VCH, New York, 2004)
- (2004) Carbon Nanotubes: Basic Concepts and Physical Properties
- Reich, S.¹ Thomson, C.² Maultzsch, J.³

13
- 0035477499
- B. Smith, D. Luzzi, J. Appl. Phys. 90, 3509 (2001)
- (2001) J. Appl. Phys , vol.90 , pp. 3509
- Smith, B.¹ Luzzi, D.²

14
- 6344270061
- S. Suzuki, K. Kanzaki, Y. Homma, S. Fukuba, Japan. J. Appl. Phys. 43, L1118 (2004)
- (2004) Japan. J. Appl. Phys , vol.43
- Suzuki, S.¹ Kanzaki, K.² Homma, Y.³ Fukuba, S.⁴

15
- 31844455097
- S. Suzuki, Y. Kobayashi, Japan. J. Appl. Phys. 44, L1498 (2005)
- (2005) Japan. J. Appl. Phys , vol.44
- Suzuki, S.¹ Kobayashi, Y.²

16
- 24344473400
- A. Vijayaraghavan, K. Kanzaki, S. Suzuki, Y. Kobayashi, H. Inokawa, Y. Ono, S. Kar, P. Ajayan, Nano Lett. 5, 1575 (2005)
- (2005) Nano Lett , vol.5 , pp. 1575
- Vijayaraghavan, A.¹ Kanzaki, K.² Suzuki, S.³ Kobayashi, Y.⁴ Inokawa, H.⁵ Ono, Y.⁶ Kar, S.⁷ Ajayan, P.⁸

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