TEM observation of the microstructure of metal-organic deposited YBa 2Cu3O7-δ with Dy additions

Superconductor Science and Technology

Volumn 20, Issue 8, 2007, Pages 880-885

  Xia, J A ^a   Long, N J ^a   Strickland, N M ^a   Hoefakker, P ^a   Talantsev, E F ^a   Li, X ^b   Zhang, W ^b   Kodenkandath, T ^b   Huang, Y ^b   Rupich, M W ^b  

^a CALLAGHAN INNOVATION   (New Zealand)

^b AMERICAN SUPERCONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; FLUX PINNING; MICROSTRUCTURE; NANOPARTICLES; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

PLANAR DEFECTS;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 34547611629     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/20/8/027     Document Type: Article

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