Defect-selective photothermal imaging: Asensitive tool for damage mapping in optical coatings

Journal of Optics A: Pure and Applied Optics

Volumn 11, Issue 4, 2009, Pages

  Sreekumar, K ^a,b  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b S K Laboratory of Photothermal Science   (India)

Author keywords

Common mode rejection demodulation (CMRD); Defect mapping; Fiber sensor; Lock in amplification; Optical beam deflection; Optical coating; Photothermal imaging

Indexed keywords

COMMON-MODE-REJECTION DEMODULATION (CMRD); DEFECT MAPPING; FIBER SENSOR; LOCK-IN AMPLIFICATION; OPTICAL BEAM DEFLECTION; PHOTOTHERMAL IMAGING;

AMPLIFICATION; DEFECTS; DEMODULATION; FUSED SILICA; MAPPING; OPTICAL COATINGS; OPTICAL MATERIALS; OPTICAL VARIABLES MEASUREMENT; OPTOELECTRONIC DEVICES; PHOTODIODES; PUMPS; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO; SILICA;

SENSORS;

EID: 70449337592     PISSN: 14644258     EISSN: 17413567     Source Type: Journal    
DOI: 10.1088/1464-4258/11/4/045506     Document Type: Article

References (38)

1. Rosencwaig A 1980 Photoacoustics and Photoacoustic Spectroscopy (New York: Wiley)
2. Almond D P and Patel P M 1996 Photothermal Science and Techniques (London: Chapman and Hall)
3. Mandelis A 2000 Phys. Today 53 29
4. Wang X, Pang Y, Ku G, Xie X, Stoica G and Wang L 2003 Nat. Biotechnol. 21 803
5. Mandelis A, Batista J and Shaughnessy D 2003 Phys. Rev. B 67 205208
6. Boyer D, Tamarat P, Maali A, Loumis B and Orrit M 2002 Science 297 1160
7. Minghua X and Lihong V W 2006 Rev. Sci. Instrum. 77 041101
8. Andreas M and Chris F 2002 Phys. Rev. E 65 021909
9. Sergey A T and Andreas M 2006 J. Biomed. Opt. 11 044006
10. Moerner W E and Orrit M 1999 Science 283 1670
11. Berciaud S, Cognet L, Blab G A and Lounis B 2004 Phys. Rev. Lett. 93 257402
12. Eberhard W 1995 Handbook of Optical Properties: Thin Films for Optical Coatings vol I ed Hummel R E and P Wibmann (Boca Raton, FL: CRC Press) pp243-72
13. Gallais L, Capoulade J, Wagner F, Natoli H Y and Commandre M 2007 Opt. Commun. 272 221
14. Roger M W 2003 Laser-induced Damage in Optical Materials (Bristol: Institute of Physics Publishing)
15. Mero M, Liu J, Rudolph W, Ristau D and Starke K 2005 Phys. Rev. B 71 115109
16. Corle T R and Kino G S 1996 Confocal Scanning Optical Microscopy and Related Imaging Systems (New York: Academic)
17. Temple P A 1981 Appl. Opt. 20 2656
18. Laux S, Mann K, Granitza B, Kaiser U and Richter W 1996 Appl. Opt. 35 6216
19. Papernov S, Schmid A W, Anzelotti J, Smith D J and Chrzan Z R 1996 Laser-Induced Damage in Optical Materials (Proc. SPIE) ed H E Bennett, A H Guenther, M R Kozlowski, B E Newnam and M J Soileau (San Jose: SPIE) pp384-94
20. Tench R J, Chow R and Kozlowski M R 1994 J. Vac. Sci. Technol. A 12 2808
21. Paesler M A and Moyer P J 1994 Near-field Optics (New York: Wiley)
22. Laurent G, Philippe V and Claude A 2004 J. Opt. Soc. Am. B 21 1073
23. Dong-Ping Z, Jianda S, Hongji Q, Ming F, Kui Y and Zhengxiu F 2006 Opt. Laser. Technol. 38 654
24. Wu Z L, Sheehan L and Kozlowski M R 1998 Opt. Express 3 376
25. Alexandre G and Mireille C 2002 Appl. Opt. 41 225
26. Mireille C and Emile P 1996 Appl. Opt. 35 5021
27. Annelise D, Caroline F and Mireille C 2004 Opt. Commun. 230 279
28. Mireille C and Emile P 1990 Appl. Opt. 29 4276
29. Annelise D, Mireille C, Caroline F, Bertrand B, Jean-Yves N, Jean-Luc R, Herve B and Philippe B 2003 Opt. Express 11 2497
30. Jackson W B, Amer N M, Boccara A C and Fournier D 1981 Appl. Opt. 20 1336
31. http://www.centronic.co.uk
32. Jonathan D S and Richard E R 1996 Rev. Sci. Instrum. 67 2481
33. Gerd E K 1999 Optical Fiber Communications (New York: McGraw-Hill)
34. Mandelis A, Paoloni S and Nicolaides L 2000 Rev. Sci. Instrum. 71 2440
35. Walter G J 1997 IC Op-Amp Cookbook (Englewood Cliffs, NJ: Prentice-Hall)
36. Bahaa E A S and Malvin C T 1991 Fundamentals of Photonics (New York: Wiley)
37. Siegman A E 1986 Lasers (California: University Science Books)
38. Chopra K L 1970 Handbook of Thin Film Technology (New York: McGraw-Hill)