Microstructural study of yttria stabilized zirconia buffered sapphire for YBa2Cu3O7-δ thin films

Journal of Applied Physics

Volumn 79, Issue 2, 1996, Pages 940-946

  Rao, M S R ^a   D'Souza, C P ^a   Apte, P R ^a   Pinto, R ^a   Gupta, L C ^a   Srinivas, S ^b   Bhatnagar, A K ^b  

^a TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

^b UNIVERSITY OF HYDERABAD   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ATOMIC FORCE MICROSCOPY; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DEPOSITION; MAGNETRON SPUTTERING; MICROSTRUCTURE; MORPHOLOGY; OXYGEN; PULSED LASER APPLICATIONS; SAPPHIRE; YTTRIUM COMPOUNDS; ZIRCONIA;

BUFFER LAYERS; PARTIAL PRESSURE; PULSED LASER DEPOSITION; YTTRIA-STABILIZED ZIRCONIA; YTTRIUM BARIUM COPPER OXIDE;

SUPERCONDUCTING FILMS;

EID: 0029754288     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360876     Document Type: Article

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