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Volumn 15, Issue 3 SPEC. ISS., 2007, Pages 349-361

On automating atomic force microscopes: An adaptive control approach

Author keywords

Adaptive control; Atomic force microscope (AFM); Model

Indexed keywords

ADAPTIVE CONTROL SYSTEMS; ATOMIC FORCE MICROSCOPY; AUTOMATION; COMPUTER SIMULATION; MATHEMATICAL MODELS; ROBUSTNESS (CONTROL SYSTEMS);

EID: 33751394418     PISSN: 09670661     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.conengprac.2005.10.006     Document Type: Article
Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.