Scanning probe recognition microscopy investigation of nanoscale mechanical and surface roughness properties along nanofibers

Materials Research Society Symposium Proceedings

Volumn 1021, Issue , 2007, Pages 102-108

  Fan, Y ^a   Chen, Q ^a   Kumar, S ^a   Baczewski, A D ^a   Udpa, L ^a   Ayres, V M ^a   Rice, A F ^b  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b Veeco Metrology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AUTO TRACKING; CURVATURE REGIONS; CURVED SURFACES; DATA POINTS; ELASTICITY ANALYSIS; ELASTICITY MEASUREMENT; FLAT SURFACES; FORCE CURVE; MEAN VALUES; MECHANICAL AND TRIBOLOGICAL PROPERTIES; MICROSCOPY SYSTEMS; NANO SCALE; NON-PLANAR OBJECTS; OPERATION TIME; PLANAR REGION; REGION OF INTEREST; SCANNING PROBE MICROSCOPY TECHNIQUES; SCANNING PROBES; SELECTIVE SCANNING; TISSUE SCAFFOLDS;

ELASTICITY; MECHANICAL PROPERTIES; METAL ANALYSIS; NANOFIBERS; NANOMECHANICS; NANOSTRUCTURED MATERIALS; PROBES; SCANNING; SCANNING PROBE MICROSCOPY; SURFACE ROUGHNESS;

SURFACE PROPERTIES;

EID: 70350426227     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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