RC variability of short-range interconnects

Proceedings - 2009 13th International Workshop on Computational Electronics, IWCE 2009

Volumn , Issue , 2009, Pages

  Twaddle, F J ^a   Cumming, D R S ^a   Roy, S ^a   Asenov, A ^a   Drysdale, T D ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INTERCONNECT VARIABILITIES; LINE EDGE ROUGHNESS; RC DELAY; ROADMAP; SIZE DEPENDENT; STANDARD CELL; STATISTICAL MODELS; TECHNOLOGY NODES; TOTAL RESISTANCE;

CAPACITANCE; ELECTRIC BATTERIES; ELECTRONICS ENGINEERING; IONIC CONDUCTION; PHOTORESISTS; ROUGHNESS MEASUREMENT; TECHNOLOGICAL FORECASTING;

INTEGRATED CIRCUITS;

EID: 70350583210     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IWCE.2009.5091143     Document Type: Conference Paper

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