Capacitance variability of short range interconnects

Journal of Computational Electronics

Volumn 7, Issue 3, 2008, Pages 124-127

  Drysdale, Timothy D ^a   Brown, Andrew R ^a   Roy, Gareth ^a   Roy, Scott ^a   Asenov, Asen ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

6T SRAM; Capacitance; Interconnect; Standard cell; Variability

Indexed keywords

COMPUTER NETWORKS; ELECTRIC BATTERIES; ELECTRON BEAM LITHOGRAPHY; FORECASTING; INTEGRATED CIRCUITS; NANOTECHNOLOGY; PHOTORESISTS; ROUGHNESS MEASUREMENT;

6T SRAM; INTERCONNECT; LINE-EDGE ROUGHNESS; STANDARD CELL; VARIABILITY;

CAPACITANCE;

EID: 50949106176     PISSN: 15698025     EISSN: 15728137     Source Type: Journal    
DOI: 10.1007/s10825-007-0154-6     Document Type: Article

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