SVD-based ghost circuitry detection

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 5806 LNCS, Issue , 2009, Pages 221-234

  Nelson, Michael ^a   Nahapetian, Ani ^a   Koushanfar, Farinaz ^b   Potkonjak, Miodrag ^a  

^a Engineering IV   (United States)

^b Rice University   (United States)

Author keywords

Gate characterization; Hardware Trojan horses; Manufacturing variability; Singular value decomposition

Indexed keywords

APPLICATION SOFTWARES; CIRCUIT FUNCTIONALITY; DEEP SUB-MICRON TECHNOLOGY; GATE CHARACTERIZATION; LEAKAGE POWER; MANUFACTURING VARIABILITY; NON-DESTRUCTIVE MEASUREMENT; SECURITY AND PRIVACY; STATISTICAL APPROACH; STATISTICAL CONSTRAINTS; SYNTHESIS TOOL; SYSTEM OF EQUATIONS; VERIFICATION TOOLS;

INDUCTION HEATING; SECURITY OF DATA;

SINGULAR VALUE DECOMPOSITION;

EID: 70350465114     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-04431-1_16     Document Type: Conference Paper

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