메뉴 건너뛰기




Volumn , Issue , 2009, Pages 460-465

Hardware aging-based software metering

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE SELECTION AND EVALUATION; CONVEX OPTIMIZATION; COPYRIGHTS; INTEGRATED CIRCUIT DESIGN; NEGATIVE BIAS TEMPERATURE INSTABILITY;

EID: 70350068434     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2009.5090709     Document Type: Conference Paper
Times cited : (19)

References (12)
  • 1
    • 70350048818 scopus 로고    scopus 로고
    • http://w3.bsa.org/globalstudy/.
  • 2
    • 70350060002 scopus 로고    scopus 로고
    • http://www.certicom.com/index.php?action=sol silicon/.
  • 3
    • 49749144533 scopus 로고    scopus 로고
    • Remote activation of ics for piracy prevention and digital right management
    • Piscataway, NJ, USA, IEEE Press
    • Yousra Alkabani, Farinaz Koushanfar, and Miodrag Potkonjak. Remote activation of ics for piracy prevention and digital right management. In ICCAD '07, pages 674-677, Piscataway, NJ, USA, 2007. IEEE Press.
    • (2007) ICCAD '07 , pp. 674-677
    • Alkabani, Y.1    Koushanfar, F.2    Potkonjak, M.3
  • 4
    • 23844466920 scopus 로고    scopus 로고
    • Impact of nbti on temporal performance degradation of digital circuits
    • H. Kufluoglu M. A. Alam B. C. Paul, K. Kang and K. Roy. Impact of nbti on temporal performance degradation of digital circuits. IEEE Electron Device Letters, 26(8):560-562, 2005.
    • (2005) IEEE Electron Device Letters , vol.26 , Issue.8 , pp. 560-562
    • Kufluoglu, H.1    Alam, M.A.2    Paul, B.C.3    Kang, K.4    Roy, K.5
  • 5
    • 84948988332 scopus 로고    scopus 로고
    • Auditable metering with lightweight security
    • Matthew K. Franklin and Dahlia Malkhi. Auditable metering with lightweight security. In FC '97, pages 151-160, 1997.
    • (1997) FC '97 , pp. 151-160
    • Franklin, M.K.1    Malkhi, D.2
  • 6
    • 36949009341 scopus 로고    scopus 로고
    • M. A. Alam K. Kang, H. Kufluoglu and K. Roy. Effcient transistor-level sizing technique under temporal performance degradation due to nbti. In ICCD06, 2006.
    • M. A. Alam K. Kang, H. Kufluoglu and K. Roy. Effcient transistor-level sizing technique under temporal performance degradation due to nbti. In ICCD06, 2006.
  • 7
    • 46149102717 scopus 로고    scopus 로고
    • An analytical model for negative bias temperature instability
    • New York, NY, USA, ACM
    • Sanjay V. Kumar, Chris H. Kim, and Sachin S. Sapatnekar. An analytical model for negative bias temperature instability. In ICCAD '06, pages 493-496, New York, NY, USA, 2006. ACM.
    • (2006) ICCAD '06 , pp. 493-496
    • Kumar, S.V.1    Kim, C.H.2    Sapatnekar, S.S.3
  • 8
    • 18744387927 scopus 로고    scopus 로고
    • Secure accounting and auditing on the web
    • Amsterdam, The Netherlands, The Netherlands, Elsevier Science Publishers B. V
    • Moni Naor and Benny Pinkas. Secure accounting and auditing on the web. In WWW7, pages 541-550, Amsterdam, The Netherlands, The Netherlands, 1998. Elsevier Science Publishers B. V.
    • (1998) WWW7 , pp. 541-550
    • Naor, M.1    Pinkas, B.2
  • 10
    • 70350046958 scopus 로고    scopus 로고
    • Robert Dixon Raymond Findley. Dual smart card access control electronic data storage and retrieval system and methods. In
    • US Patent, number 5629508
    • Jr. Robert Dixon Raymond Findley. Dual smart card access control electronic data storage and retrieval system and methods. In US Patent, number 5629508, 1999.
    • (1999)
    • Jr1
  • 12
    • 34247891689 scopus 로고    scopus 로고
    • Negative bias temperature instability: What do we understand?
    • Dieter K. Schroder. Negative bias temperature instability: What do we understand? Microelectron. Eng., 47(6):841-852, 2007.
    • (2007) Microelectron. Eng , vol.47 , Issue.6 , pp. 841-852
    • Schroder, D.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.