Post-silicon timing characterization by compressed sensing

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2008, Pages 185-189

  Koushanfar, Farinaz ^a   Boufounos, Petros ^a   Shamsi, Davood ^a  

^a RICE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARK CIRCUITS; COMPRESSED SENSING; ESTIMATION METHODS; GATE DELAYS; NEW THEORIES; SPARSE BASIS; TESTING METHODS; TIMING CHARACTERIZATIONS; TIMING MEASUREMENTS; TIMING VARIATIONS; WAVELET DOMAINS;

BENCHMARKING; COMPUTER AIDED DESIGN; SIGNAL RECONSTRUCTION;

TIME MEASUREMENT;

EID: 57849113504     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2008.4681572     Document Type: Conference Paper

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