-
3
-
-
33746447294
-
Anisotropic diffraction-line broadening due to microstrain distribution; Parametrisation opportunities
-
Leineweber, A.: Anisotropic diffraction-line broadening due to microstrain distribution; Parametrisation opportunities. J. Appl. Crystallogr. 39 (2006) 509-518.
-
(2006)
J. Appl. Crystallogr
, vol.39
, pp. 509-518
-
-
Leineweber, A.1
-
5
-
-
33745632462
-
Anisotropic micro-strain broadening due to compositional inhomogeneities and its parametrisation
-
Leineweber, A.; Mittemeijer, E. J.: Anisotropic micro-strain broadening due to compositional inhomogeneities and its parametrisation. Z. Kristallogr. Suppl. 23 (2006) 117-122.
-
(2006)
Z. Kristallogr. Suppl.
, vol.23
, pp. 117-122
-
-
Leineweber, A.1
Mittemeijer, E.J.2
-
6
-
-
0003472812
-
-
Dover Publications, Inc., New York
-
Warren, B. E.: X-ray Diffraction, Dover Publications, Inc., New York (1990).
-
(1990)
X-ray Diffraction
-
-
Warren, B.E.1
-
7
-
-
50149096576
-
Nitride precipitation and coarsening in Fe-2.23 at% V alloys: XRD and (HR) TEM study of coherent and incoherent diffraction effects caused by misfitting nitride precipitates in a ferrite matrix
-
Vives Diaz, N. E.; Hosmani, S. S.; Schacherl, R. E.; Mittmeijer, E. J.: Nitride precipitation and coarsening in Fe-2.23 at% V alloys: XRD and (HR) TEM study of coherent and incoherent diffraction effects caused by misfitting nitride precipitates in a ferrite matrix. Acta Mater. 56 (2008) 4137-41849.
-
(2008)
Acta Mater.
, vol.56
, pp. 4137-41849
-
-
Diaz, V.N.E.1
Hosmani, S.S.2
Schacherl, R.E.3
Mittmeijer, E.J.4
-
8
-
-
33645936110
-
The diffraction of X rays by distorted crystal aggregates-I
-
Stokes, A. R.; Wilson, A. J. C.: The diffraction of X rays by distorted crystal aggregates-I. Proc. Phys. Soc. Lond. 56 (1944) 174-181.
-
(1944)
Proc. Phys. Soc. Lond
, vol.56
, pp. 174-181
-
-
Stokes, A.R.1
Wilson, A.J.C.2
-
9
-
-
0001624441
-
The effects of dislocations on X-ray diffraction
-
Wilson, A. J. C.: The effects of dislocations on X-ray diffraction. Nuovo Cimento 1 (1955) 277-283.
-
(1955)
Nuovo Cimento
, vol.1
, pp. 277-283
-
-
Wilson, A.J.C.1
-
10
-
-
0028445217
-
Applicabilities of the Warren-Averbach analysis and an alternative analysis of size and strain broadening
-
Berkum, J. G. M. van; Vermeulen, A. C.; Delhez, R.; de Keijser, Th. H.; Mittemeijer, E. J.: Applicabilities of the Warren-Averbach Analysis and an alternative analysis of size and strain broadening. J. Appl. Crystallogr. 27 (1994) 345-357.
-
(1994)
J. Appl. Crystallogr
, vol.27
, pp. 345-357
-
-
Berkum, J.G.M.V.1
Vermeulen, A.C.2
Delhez, R.3
De Keijser, Th.H.4
Mittemeijer, E.J.5
-
11
-
-
0000344888
-
Diffraction-line broadening due to strain fields in materials; Fundamental aspects and methods of analysis
-
Berkum, J. G. M. van; Delhez, R.; de Keijser, Th. H.; Mittemeijer, E. J.: Diffraction-line broadening due to strain fields in materials; Fundamental aspects and methods of analysis. Acta Crystallogr. A52 (1996) 730-747.
-
(1996)
Acta Crystallogr
, vol.A52
, pp. 730-747
-
-
Berkum, J.G.M.V.1
Delhez, R.2
De Keijser, T.H.3
Mittemeijer, E.J.4
-
12
-
-
70350196906
-
-
Weinheim: Physik-Verlag
-
Haussühl, S.: Kristallphysik. Weinheim: Physik-Verlag (1983).
-
(1983)
Kristallphysik
-
-
Diehl, H.S.1
-
13
-
-
0343495903
-
Anomalous peak broadening in high-resolution powder diffraction patterns
-
Elcombe, M. M.; Howard, C. J.: Anomalous peak broadening in high-resolution powder diffraction patterns. Mater. Sci. Forum 27/28 (1988) 71-76.
-
(1988)
Mater. Sci. Forum
, vol.27-28
, pp. 71-76
-
-
Elcombe, M.M.1
Howard, C.J.2
-
15
-
-
0000953036
-
The (hkl) dependence of diffraction-line broadening caused by strain and size for all Laue groups in Rietveld refinement
-
Popa, N. C.: The (hkl) dependence of diffraction-line broadening caused by strain and size for all Laue groups in Rietveld refinement, J. Appl. Crystallogr. 31 (1998) 176-180.
-
(1998)
J. Appl. Crystallogr.
, vol.31
, pp. 176-180
-
-
Popa, N.C.1
-
16
-
-
0001436539
-
Phenomenological model of anisotropic peak broadening in powder diffraction
-
Stephens, P. W.: Phenomenological model of anisotropic peak broadening in powder diffraction. J. Appl. Crystallogr. 32 (1999) 281-289.
-
(1999)
J. Appl. Crystallogr
, vol.32
, pp. 281-289
-
-
Stephens, P.W.1
-
17
-
-
33947309705
-
Anisotropic microstrain broadening due to fieldtensor distributions
-
Leineweber, A.: Anisotropic microstrain broadening due to fieldtensor distributions. J. Appl. Crystallogr. 40 (2007) 362-370.
-
(2007)
J. Appl. Crystallogr
, vol.40
, pp. 362-370
-
-
Leineweber, A.1
-
18
-
-
0000272372
-
Note on aberrations of a fixed-angle energydispersive powder diffractometer
-
Wilson, A. J. C.: Note on Aberrations of a fixed-angle energydispersive powder diffractometer. J. Appl. Crystallogr. 6 (1973) 230.
-
(1973)
J. Appl. Crystallogr.
, vol.6
, pp. 230
-
-
Wilson, A.J.C.1
-
19
-
-
62749092092
-
Cumulants and moments in the line profile analysis
-
Cernansky, M.: Cumulants and moments in the line profile analysis. Z. Kristallogr. Suppl. 27 (2008) 127-133.
-
(2008)
Z. Kristallogr. Suppl.
, vol.27
, pp. 127-133
-
-
Cernansky, M.1
-
21
-
-
0011731053
-
'Third-Order' Elastic Coefficients
-
Hearmon, R. F. S.: 'Third-Order' Elastic Coefficients. Acta Crystallogr. 6 (1953) 331-340.
-
(1953)
Acta Crystallogr.
, vol.6
, pp. 331-340
-
-
Hearmon, R.F.S.1
-
22
-
-
0001883189
-
Fourth-, fifth-and sixth-order elastic constants in crystals
-
Chung, D. Y.; Li, Y.: Fourth-, Fifth-and Sixth-Order Elastic Constants in Crystals. Acta Crystallogr. A30 (1974) 1-13.
-
(1974)
Acta Crystallogr.
, vol.A30
, pp. 1-13
-
-
Chung, D.Y.1
Li, Y.2
-
23
-
-
70350201388
-
Tensor properties and rotational symmetry of crystals.2. groups with 1-fold, 2-fold and 4-fold principal symmetry and trigonal and hexagonal groups different from group-3
-
Fumi, F. G.; Ripamonti, C.: Tensor properties and rotational symmetry of crystals.2. groups with 1-fold, 2-fold and 4-fold principal symmetry and trigonal and hexagonal groups different from group-3. Acta Crystallogr. A36 (1980) 551-558.
-
(1980)
Acta Crystallogr.
, vol.A36
, pp. 551-558
-
-
Fumi, F.G.1
Ripamonti, C.2
-
24
-
-
0344011640
-
Effect of the degree of nitrogen long-range-order on the lattice parameter of ε-iron nitrides
-
Liapina, T.; Leineweber, A.; Mittemeijer, E. J.; Kockelmann, W.: Effect of the degree of nitrogen long-range-order on the lattice parameter of ε-iron nitrides. Acta Mater. 52 (2004) 173-180.
-
(2004)
Acta Mater.
, vol.52
, pp. 173-180
-
-
Liapina, T.1
Leineweber, A.2
Mittemeijer, E.J.3
Kockelmann, W.4
-
27
-
-
0026852338
-
A fundamental parameters approach to X-ray line-profile fitting
-
Cheary, R. W.; Coelho, A.: A fundamental parameters approach to X-ray line-profile fitting. J. Appl. Crystallogr. 25 (1992) 109-121.
-
(1992)
J. Appl. Crystallogr.
, vol.25
, pp. 109-121
-
-
Cheary, R.W.1
Coelho, A.2
-
28
-
-
0002450903
-
Introduction to the rietveld method
-
in, edited by R. A, Young, Oxford University Press, Oxford, UK
-
Young, R. A.: Introduction to the Rietveld method, in The Rietveld Method, edited by R. A. Young, Oxford University Press, Oxford, UK (1995) pp. 1-38.
-
(1995)
The Rietveld Method
, pp. 1-38
-
-
Young, R.A.1
-
29
-
-
0001678764
-
Atomic displacement parameter nomenclature. Report of a subcommittee on atomic displacement parameter nomenclature
-
Trueblood, K. N.; Bürgi, H.-B.; Burzlaff, H.; Dunitz, J. D.; Gramaccioli, C. M.; Schulz, H. H.; Shmueli, U.; Abrahams, S. C.: Atomic displacement parameter nomenclature. Report of a Subcommittee on Atomic Displacement Parameter Nomenclature. Acta Crystallogr. A52 (1996) 770-781.
-
(1996)
Acta Crystallogr.
, vol.A52
, pp. 770-781
-
-
Trueblood, K.N.1
Bürgi, H.-B.2
Burzlaff, H.3
Dunitz, J.D.4
Gramaccioli, C.M.5
Schulz, H.H.6
Shmueli, U.7
Abrahams, S.C.8
-
30
-
-
0001400795
-
Statistical approaches for the treatment of anharmonic motion in crystals. I. A comparison of the most frequently used formalisms of anharmonic thermal vibrations
-
Zucker, U. H.; Schulz, H.: Statistical approaches for the treatment of anharmonic motion in crystals. I. A comparison of the most frequently used formalisms of anharmonic thermal vibrations. Acta Crystallogr. A38 (1982) 563-568.
-
(1982)
Acta Crystallogr.
, vol.A38
, pp. 563-568
-
-
Zucker, U.H.1
Schulz, H.2
-
31
-
-
70350193485
-
A deficiency of the cumulant expansion of the anharmonic temperature factor
-
Scheringer, C.: A deficiency of the cumulant expansion of the anharmonic temperature factor. Acta Crystallogr. A41 (1985) 79-81.
-
(1985)
Acta Crystallogr.
, vol.A41
, pp. 79-81
-
-
Scheringer, C.1
-
32
-
-
33846789188
-
X-ray studies of deformed metals
-
Warren, B. E.: X-ray studies of deformed metals. Prog. Met. Phys. 8 (1959) 147-202.
-
(1959)
Prog. Met. Phys.
, vol.8
, pp. 147-202
-
-
Warren, B.E.1
-
33
-
-
0034496849
-
Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powderpattern fitting
-
Langford, J. I.; Louer D.; Scardi, P.: Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powderpattern fitting, J. Appl. Crystallogr. 33 (2000).
-
(2000)
J. Appl. Crystallogr.
, vol.33
-
-
Langford, J.I.1
Louer, D.2
Scardi, P.3
-
34
-
-
0036080145
-
An analytical approximation for a sizebroadened profile given by the lognormal and gamma distributions
-
Popa, N. C.; Balzar, D.: An analytical approximation for a sizebroadened profile given by the lognormal and gamma distributions. J. Appl. Crystallogr. 35 (2002) 338-346.
-
(2002)
J. Appl. Crystallogr.
, vol.35
, pp. 338-346
-
-
Popa, N.C.1
Balzar, D.2
-
35
-
-
33746896245
-
Stacking faults and twin boundaries in fcc crystals determined by x-ray diffraction profile analysis
-
Balogh, L.; Ribarik, G.; Ungar, T.: Stacking faults and twin boundaries in fcc crystals determined by x-ray diffraction profile analysis. J. Appl. Phys. 100 (2006) 023512-1-10.
-
(2006)
J. Appl. Phys.
, vol.100
, pp. 0235121-0235130
-
-
Balogh, L.1
Ribarik, G.2
Ungar, T.3
-
36
-
-
25444508683
-
The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals
-
Estevez-Rams, E.; Penton, A.; Martinez-Garcia, J., Fuess, H.: The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals. Cryst. Res. Techn. 40 (2005) 166-176.
-
(2005)
Cryst. Res. Techn
, vol.40
, pp. 166-176
-
-
Estevez-Rams, E.1
Penton, A.2
Martinez-Garcia, J.3
Fuess, H.4
-
37
-
-
0018469113
-
Simplifications in the X-ray line-shape analysis
-
Adler, T.; Houska, C. R.: Simplifications in the X-ray line-shape analysis. J. Appl. Phys. 50 (1979) 3282-3287.
-
(1979)
J. Appl. Phys.
, vol.50
, pp. 3282-3287
-
-
Adler, T.1
Houska, C.R.2
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