Cumulants and moments in the line profile analysis

Zeitschrift fur Kristallographie, Supplement

Volumn , Issue 27, 2008, Pages 127-133

  Cernansky M ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Cumulants; Diffraction profile; Moments; Single line method

Indexed keywords

EID: 62749092092     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2008.0017     Document Type: Conference Paper

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