The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals

Crystal Research and Technology

Volumn 40, Issue 1-2, 2005, Pages 166-176

  Estevez Rams, E ^a   Penton, A ^a   Martinez Garcia, J ^a   Fuess, H ^b  

^a UNIVERSITY OF HAVANA   (Cuba)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Peak profile functions; Stacking faults; XRD pattern

Indexed keywords

CORRELATION METHODS; DATA REDUCTION; FUNCTIONS; PROBABILITY; STACKING FAULTS; X RAY DIFFRACTION ANALYSIS;

ASYMMETRIC COMPONENT; CORRELATION FUNCTIONS; PEAK PROFILE FUNCTIONS; XRD PATTERN;

CRYSTALS;

EID: 25444508683     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.200410320     Document Type: Article

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