Chemical imaging of interfaces by sum-frequency generation

Materials Science and Engineering C

Volumn 8-9, Issue , 1999, Pages 335-341

  Flörsheimer, Mathias ^a   Brillert, Christof ^a   Fuchs, Harald ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Second harmonic microscope; Sum frequency microscope; Surface order and symmetry

Indexed keywords

EID: 0000155028     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0928-4931(99)00047-8     Document Type: Article

References (30)

1. R. Wiesendanger (Ed.), Scanning Probe Microscopy, Analytical Methods, Springer-Verlag, Berlin, 1998, pp. 1-216.
2. Treado P.J. Laser Focus World. 31:1995;75.
3. Batchelder D.N., Cheng Ch., Pitt G.D. Adv. Mater. 3:1991;566.
4. Dhamelincourt P., Barbillat J., Delhaye M. Spectroscopy Europe. 5:1993;16.
5. Evans S.D., Freeman T.L., Flynn T.M., Batchelder D.N., Ulman A. Thin Solid Films. 244:1994;778.
6. M. Flörsheimer, Ch. Brillert, H. Fuchs, Langmuir, in press, published in the Web, February 24, 1999 (http://pubs.acs.org).
7. Shen Y.R. Nature. 337:1989;519.
8. Vogel V., Shen Y.R. Annu. Rev. Mater. Sci. 21:1991;515.
9. Buck M. Appl. Phys. A. 55:1992;395.
10. Lüpke G., Marowski G. Phys. Bl. 49:1993;285.
11. Corn R.M., Higgings D.A. Chem. Rev. 94:1994;107.
12. Bain C.D. J. Chem. Soc. Faraday Trans. 91:1995;1281.
13. J.F. McGilp, in: S.G. Davison, et al. (Eds.), Progress in Surface Science, Vol. 49, Elsevier, Oxford, 1995, p. 1.
14. Eisenthal K.B. Chem. Rev. 96:1996;1343.
15. Flörsheimer M., Jundt D.H., Looser H., Sutter K., Günter P. J. Phys. Chem. 98:1994;6399.
16. Flörsheimer M., Looser H., Küpfer M., Günter P. Thin Solid Films. 244:1994;1001.
17. Flörsheimer M., Radüge Ch., Salmen H., Bösch M., Terbrack R., Fuchs H. Thin Solid Films. 284-285:1996;659.
18. Flörsheimer M., Bösch M., Brillert Ch., Wierschem M., Fuchs H. Supramolecular Science. 4:1997;255.
19. Flörsheimer M., Salmen H., Bösch M., Brillert Ch., Wierschem M., Fuchs H. Adv. Mater. 9:1997;1056.
20. Schulz K.A., Seebauer E.G. J. Chem. Phys. 97:1992;6958.
21. Schulz K.A., Suni I.I., Seebauer E.G. J. Opt. Soc. Am. B. 10:1993;546.
22. Flörsheimer M., Bösch M., Brillert Ch., Wierschem M., Fuchs H. Adv. Mater. 9:1997;1061.
23. Flörsheimer M., Bösch M., Brillert Ch., Wierschem M., Fuchs H. Thin Solid Films. 327-329:1998;241.
24. M. Flörsheimer, habilitation thesis, Münster, 1997.
25. M. Plate, M. Overs, H.-J. Schäfer, Synthesis (1998) 1255.
26. Jacobi S., Chi L.F., Plate M., Overs M., Schaefer H.-J., Fuchs H. Thin Solid Films. 327-329:1998;180.
27. MacPhail R.A., Strauss H.L., Snyder R.G., Elliger C.A. J. Phys. Chem. 88:1984;334.
28. Guyot-Sionnest P., Hunt J.H., Shen Y.R. Phys. Rev. Lett. 59:1987;1597.
29. Bubeck Ch. Adv. Mater. 2:1990;537.
30. Bell G.R., Bain C.D., Ward R.N. Chem. Soc. Faraday Trans. 92:1996;515.