Methodology for efficient substrate noise analysis in large-scale mixed-signal circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 17, Issue 10, 2009, Pages 1405-1418

  Salman, Emre ^a   Jakushokas, Renatas ^a   Friedman, Eby G ^a   Secareanu, Radu M ^b   Hartin, Olin L ^b  

^a University of Rochester   (United States)

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

Ground noise; High level analysis methodology; Mixed signal ICs; Substrate coupling noise; Substrate extraction; Substrate noise analysis

Indexed keywords

GROUND NOISE; HIGH LEVEL ANALYSIS METHODOLOGY; MIXED-SIGNAL ICS; SUBSTRATE COUPLING NOISE; SUBSTRATE NOISE ANALYSIS;

ALGORITHMS; COMPUTATIONAL COMPLEXITY; COMPUTATIONAL EFFICIENCY; COUPLED CIRCUITS; DIGITAL CIRCUITS; DISTRIBUTED PARAMETER NETWORKS; MERGERS AND ACQUISITIONS;

SUBSTRATES;

EID: 70349755719     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2008.2003518     Document Type: Article

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