Charge spectroscopy of Si nanocrystallites embedded in a SiO2 matrix

Journal of Applied Physics

Volumn 106, Issue 6, 2009, Pages

  Antonova, Irina V ^a   Volodin, Vladimir A ^a,b   Neustroev, Efim P ^c   Smagulova, Svetlana A ^c   Jedrzejewsi, Jedrzej ^d   Balberg, Isaac ^d  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^b NOVOSIBIRSK STATE UNIVERSITY   (Russian Federation)

^c NORTH EASTERN FEDERAL UNIVERSITY   (Russian Federation)

^d HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DLTS; ELECTRONIC LEVELS; INSULATING MATRIX; MATRIX; QUANTUM CONFINEMENT ENERGY; SI NANOCRYSTALLITES; SILICON DIOXIDE; SURFACE COUPLING;

EMBEDDED SYSTEMS; NANOCRYSTALLITES; QUANTUM CONFINEMENT; SILICA; SILICON; SILICON OXIDES;

DEEP LEVEL TRANSIENT SPECTROSCOPY;

EID: 70349650330     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3224865     Document Type: Article

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