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Volumn 6, Issue 3, 2009, Pages 765-771
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Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVE GRAINS;
AS-GROWN;
ELECTRICAL ACTIVITIES;
METAL PRECIPITATES;
MICRO SPECTROSCOPY;
MONOCRYSTALLINE WAFERS;
MULTICRYSTALLINE SI;
RECOMBINATION ACTIVITY;
SYNCHROTRON-BASED MICROPROBE;
X RAY BEAM;
X-RAY FLUORESCENCE MICROSCOPY;
DEFECTS;
FLUORESCENCE MICROSCOPY;
GRAIN BOUNDARIES;
MICROELECTRONICS;
PHOTOVOLTAIC EFFECTS;
POLYSILICON;
PRECIPITATION (CHEMICAL);
SILICIDES;
SYNCHROTRONS;
TRANSITION METALS;
SILICON WAFERS;
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EID: 70349227335
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200880717 Document Type: Conference Paper |
Times cited : (13)
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References (15)
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