메뉴 건너뛰기




Volumn 6, Issue 3, 2009, Pages 765-771

Synchrotron microscopy and spectroscopy for analysis of crystal defects in silicon

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE GRAINS; AS-GROWN; ELECTRICAL ACTIVITIES; METAL PRECIPITATES; MICRO SPECTROSCOPY; MONOCRYSTALLINE WAFERS; MULTICRYSTALLINE SI; RECOMBINATION ACTIVITY; SYNCHROTRON-BASED MICROPROBE; X RAY BEAM; X-RAY FLUORESCENCE MICROSCOPY;

EID: 70349227335     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200880717     Document Type: Conference Paper
Times cited : (13)

References (15)
  • 10
    • 77952577671 scopus 로고    scopus 로고
    • M. Seibt, private communication
    • M. Seibt, private communication.
  • 12
    • 77952565517 scopus 로고    scopus 로고
    • W. Seifert et al., to be published in Superlattices Microstruct
    • W. Seifert et al., to be published in Superlattices Microstruct.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.