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Volumn , Issue , 2008, Pages

Comparative collector design in InGaAs and GaAsSb based InP DHBTs

Author keywords

Base collector transit time; GaAsSb base; InGaAs base; InP heterojunction bipolar transistor

Indexed keywords

BASE-COLLECTOR TRANSIT TIME; BASE-COLLECTORS; COLLECTOR CURRENTS; DOUBLE HETEROJUNCTION BIPOLAR TRANSISTORS; GAASSB BASE; HETEROSTRUCTURES; INGAAS BASE; INP; INP HETEROJUNCTION BIPOLAR TRANSISTOR; OPERATING CURRENTS; TRANSIT TIME; TYPE II;

EID: 70149098769     PISSN: 10928669     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIPRM.2008.4702996     Document Type: Conference Paper
Times cited : (4)

References (9)
  • 3
    • 0037004969 scopus 로고    scopus 로고
    • max InP/InGaAs double heterojuntion bipolar transistors with a thin pseudomorphic base
    • December
    • max InP/InGaAs double heterojuntion bipolar transistors with a thin pseudomorphic base", IEEE Electron Device Letters, vol. 23, no. 12, pp. 694-696, December 2002.
    • (2002) IEEE Electron Device Letters , vol.23 , Issue.12 , pp. 694-696
    • Ida, M.1    Kurishima, K.2    Watanabe, N.3
  • 5
    • 4444303479 scopus 로고    scopus 로고
    • DFF-drivers ICs for 40 Gb/s ETDM in InP DHBT technology
    • 6-11 June
    • A.Konczykowska, F. Jorge, M. Riet, S. Blayac, J. Moulu, J. Godin,"DFF-drivers ICs for 40 Gb/s ETDM in InP DHBT technology" IMS 04, vol.1, pp. 113-116, 6-11 June 2004.
    • (2004) IMS 04 , vol.1 , pp. 113-116
    • Konczykowska, A.1    Jorge, F.2    Riet, M.3    Blayac, S.4    Moulu, J.5    Godin, J.6
  • 6
    • 0042914299 scopus 로고    scopus 로고
    • Simple and accurate method to extract intrinsic and extrinsic base-collector capacitance of bipolar transistors
    • August
    • S. Blayac, M. Kahn, M. Riet, P. Berdaguer and J. Godin, "Simple and accurate method to extract intrinsic and extrinsic base-collector capacitance of bipolar transistors", Electronics Letters, vol.39, no.17, pp. 1282-1283, August 2003.
    • (2003) Electronics Letters , vol.39 , Issue.17 , pp. 1282-1283
    • Blayac, S.1    Kahn, M.2    Riet, M.3    Berdaguer, P.4    Godin, J.5
  • 7
    • 6644225001 scopus 로고    scopus 로고
    • Submicron scaling of HBTs
    • November
    • M.J.W. Rodwell et al., "Submicron scaling of HBTs", IEEE Transactions on Electron Devices, vol. 48, no. 11, pp. 2606-2624, November 2001.
    • (2001) IEEE Transactions on Electron Devices , vol.48 , Issue.11 , pp. 2606-2624
    • Rodwell, M.J.W.1
  • 8
    • 14844360859 scopus 로고    scopus 로고
    • Extraction of the average collector velocity in high-speed NpN InP/GaAsSb/InP DHBTs
    • H.G. Liu, N. Tao, S.P. Watkins and C.R. Bolognesi, "Extraction of the average collector velocity in high-speed NpN InP/GaAsSb/InP DHBTs", IPRM 2004, pp. 556-557.
    • (2004) IPRM , pp. 556-557
    • Liu, H.G.1    Tao, N.2    Watkins, S.P.3    Bolognesi, C.R.4
  • 9
    • 34748898928 scopus 로고    scopus 로고
    • Kirk effect in type-II InP/GaAsSb DHBTs with a collector doping spike
    • H.G. Liu, Y. P. Zeng, O. Ostinelli and C.R. Bolognesi, "Kirk effect in type-II InP/GaAsSb DHBTs with a collector doping spike", IPRM 2007, pp. 409-411.
    • (2007) IPRM , pp. 409-411
    • Liu, H.G.1    Zeng, Y.P.2    Ostinelli, O.3    Bolognesi, C.R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.