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Volumn 7, Issue 2, 2008, Pages
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Investigation and characterization of highly efficient near-infrared scanning gratings used in near-infrared microspectrometers
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Author keywords
Micromechanical reflection grating; Microscanning mirror; Scanning grating; Spectrometer; Spectroscopy
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Indexed keywords
DIGITAL SIGNAL PROCESSORS;
INFRARED DEVICES;
INVESTMENTS;
SCANNING;
SIGNAL PROCESSING;
SPECTROMETRY;
SPECTRUM ANALYZERS;
CONTROL STRUCTURE;
DEFLECTION ANGLES;
FABRICATION PROCESS;
GRATING STRUCTURES;
INGAAS DIODE;
KEY PARAMETERS;
MECHANICAL SHOCK;
MICRO-SCANNING;
MICROSPECTROMETERS;
NANO METER RANGE;
NEAR INFRARED;
NIR SPECTROMETER;
PULSED VOLTAGES;
REFLECTION GRATINGS;
SCANNING GRATING;
SPECTRAL EFFICIENCIES;
SPECTRAL MEASUREMENT;
SPECTRAL RANGE;
STATIC DEFORMATIONS;
SPECTROMETERS;
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EID: 70049105992
PISSN: 19325150
EISSN: 19325134
Source Type: Journal
DOI: 10.1117/1.2911035 Document Type: Conference Paper |
Times cited : (7)
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References (19)
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