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Volumn 156, Issue 10, 2009, Pages
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Photoelectrochemical undercut etching of m-Plane GaN for microdisk applications
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Author keywords
[No Author keywords available]
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Indexed keywords
BAND GAPS;
DEVICE APPLICATION;
EPITAXIAL STRUCTURE;
ETCHANT CONCENTRATIONS;
ILLUMINATION INTENSITY;
IN-PLANE POLARIZATION;
M-PLANE;
MASKING MATERIAL;
MICRODISK LASER;
MICRODISKS;
NON-POLAR;
NONPOLAR M-PLANE;
OPTICAL CAVITIES;
PHOTO-ELECTROCHEMICAL ETCHING;
PHOTOELECTROCHEMICALS;
QUANTUM CONFINED STARK EFFECT;
UNDERCUT ETCHING;
GALLIUM ALLOYS;
GALLIUM NITRIDE;
LIGHT TRANSMISSION;
OPTICAL INSTRUMENTS;
SEMICONDUCTING GALLIUM;
SPECTROSCOPY;
VIDEODISKS;
ETCHING;
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EID: 69549105974
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.3184156 Document Type: Article |
Times cited : (16)
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References (16)
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