Simulation and analysis of random decision errors in clocked comparators

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 56, Issue 8, 2009, Pages 1844-1857

  Kim, Jaeha ^a,b   Leibowitz, Brian S ^a   Ren, Jihong ^a   Madden, Chris J ^a  

^a RAMBUS INC   (United States)

^b Stanford University   (United States)

Author keywords

Circuit analysis; Circuit noise; Circuit simulation; Comparators

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CLOCKS; COMPARATOR CIRCUITS; COMPARATORS (OPTICAL); ELECTRIC NETWORK ANALYSIS; RANDOM ERRORS; STOCHASTIC MODELS; STOCHASTIC SYSTEMS;

ANALOG TO DIGITAL CONVERTERS; CIRCUIT NOISE; GENERAL STOCHASTIC SYSTEMS; LABORATORY MEASUREMENTS; NOISE-SENSITIVE APPLICATIONS; PERIODICALLY TIME-VARYING; SIMULATION AND ANALYSIS; TIME-VARYING DYNAMICS;

CIRCUIT SIMULATION;

EID: 69449085120     PISSN: 15498328     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2009.2028449     Document Type: Conference Paper

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