Experimental Investigation of the Minimum Signal for Reliable Operation of DRAM Sense Amplifiers

IEEE Journal of Solid-State Circuits

Volumn 27, Issue 7, 1992, Pages 1028-1035

  Geib, Heribert ^a   Weber, Werner ^a   Wohlrab, Erdi ^a   Risch, Lothar ^a  

^a SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS; DATA STORAGE, SEMICONDUCTOR; ELECTRIC MEASUREMENTS; ELECTRONIC CIRCUITS, TRIGGER;

SENSE AMPLIFIERS; SENSE SIGNALS;

DATA STORAGE, DIGITAL;

EID: 0026896296     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/4.142598     Document Type: Article

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