Characterizing sampling aperture of clocked comparators

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2008, Pages 68-69

  Jeeradit, M ^a   Kim, J ^a   Leibowitz, B ^a   Nikaeen, P ^b   Wang, V ^c   Garlepp, B ^d   Werner, C ^a  

^a RAMBUS INC   (United States)

^b STANFORD UNIVERSITY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d SiTime Corporation   (United States)

Author keywords

Aperture and impulse sensitivity function; Comparator

Indexed keywords

CLOCKS; COMPARATORS (OPTICAL); VLSI CIRCUITS;

90-NM CMOS; APERTURE AND IMPULSE SENSITIVITY FUNCTION; IMPULSE SENSITIVITY FUNCTIONS; SIMULATIONS AND MEASUREMENTS; STRONGARM; TEST-CHIP;

COMPARATOR CIRCUITS;

EID: 51949098744     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIC.2008.4585955     Document Type: Conference Paper

References (6)

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