Characterization of random decision errors in clocked comparators

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2008, Pages 691-694

  Leibowitz, B S ^a   Kim, J ^a   Ren, J ^a   Madden, C J ^a  

^a RAMBUS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

90NM CMOS; A/D CONVERTERS; DECISION ERROR PROBABILITIES; DECISION ERRORS; EXCESS NOISE FACTORS; LABORATORY MEASUREMENTS; LINE DETECTORS; MEMORY BITS; NOISE MODELS; OUTPUT LEVELS; PERIODIC NOISES; PERIODICALLY TIME-VARYING; RANDOM NOISES; RF CIRCUITS; SENSITIVE APPLICATIONS; SHORT CHANNELS; SIMULATION RESULTS; SMALL SIGNALS; WIDESPREAD USES;

CIRCUIT SIMULATION; COMPARATORS (OPTICAL); INTEGRATED CIRCUITS; NETWORKS (CIRCUITS); PROBABILITY; RANDOM ERRORS; RANDOM PROCESSES; SIGNAL PROCESSING; TIME VARYING NETWORKS; TIME VARYING SYSTEMS;

ELECTRIC NETWORK ANALYSIS;

EID: 57849092725     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2008.4672180     Document Type: Conference Paper

References (8)

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