-
1
-
-
3342928693
-
-
K.K. Larsen, V. Privitera, S. Coffa, F. Priolo, S.U. Campisano, and A. Camera, Phys. Rev. Lett. 76, 1493 (1996); V. Privitera et al., Appl. Phys. Lett. 68, 3422 (1996).
-
(1996)
Phys. Rev. Lett.
, vol.76
, pp. 1493
-
-
Larsen, K.K.1
Privitera, V.2
Coffa, S.3
Priolo, F.4
Campisano, S.U.5
Camera, A.6
-
2
-
-
0006353927
-
-
K.K. Larsen, V. Privitera, S. Coffa, F. Priolo, S.U. Campisano, and A. Camera, Phys. Rev. Lett. 76, 1493 (1996); V. Privitera et al., Appl. Phys. Lett. 68, 3422 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 3422
-
-
Privitera, V.1
-
6
-
-
0000778916
-
-
N. E. B. Cowern, K. T. F. Janssen, G. F. A. van de Walle, and D. J. Gravesteijn, Phys. Rev. Lett. 65, 2434 (1990); N. E. B. Cowern, G. F. A. van de Walle, D. J. Gravesteijn, and C. J. Vriezema, Phys. Rev, Lett. 67, 212 (1991).
-
(1990)
Phys. Rev. Lett.
, vol.65
, pp. 2434
-
-
Cowern, N.E.B.1
Janssen, K.T.F.2
Van De Walle, G.F.A.3
Gravesteijn, D.J.4
-
7
-
-
5544271304
-
-
N. E. B. Cowern, K. T. F. Janssen, G. F. A. van de Walle, and D. J. Gravesteijn, Phys. Rev. Lett. 65, 2434 (1990); N. E. B. Cowern, G. F. A. van de Walle, D. J. Gravesteijn, and C. J. Vriezema, Phys. Rev, Lett. 67, 212 (1991).
-
(1991)
Phys. Rev, Lett.
, vol.67
, pp. 212
-
-
Cowern, N.E.B.1
Van De Walle, G.F.A.2
Gravesteijn, D.J.3
Vriezema, C.J.4
-
8
-
-
11944271719
-
-
N. E. B. Cowern, G. F. A. van de Walle, P. C. Zalm, and D. J. Oostra, Phys. Rev. Lett. 69, 116 (1992).
-
(1992)
Phys. Rev. Lett.
, vol.69
, pp. 116
-
-
Cowern, N.E.B.1
Van De Walle, G.F.A.2
Zalm, P.C.3
Oostra, D.J.4
-
9
-
-
25044480747
-
-
C. S. Nichols, C. G. Van de Walle, and S.T. Pantelides, Phys. Rev. Lett. 62, 1049 (1989); Phys. Rev. B 40, 5484 (1989); J. Zhu et al., Phys. Rev. B 54, 4741 (1996); J. Zhu, Comput. Mater. Sci. 12, 309 (1998).
-
(1989)
Phys. Rev. Lett.
, vol.62
, pp. 1049
-
-
Nichols, C.S.1
Van De Walle, C.G.2
Pantelides, S.T.3
-
10
-
-
5244356706
-
-
C. S. Nichols, C. G. Van de Walle, and S.T. Pantelides, Phys. Rev. Lett. 62, 1049 (1989); Phys. Rev. B 40, 5484 (1989); J. Zhu et al., Phys. Rev. B 54, 4741 (1996); J. Zhu, Comput. Mater. Sci. 12, 309 (1998).
-
(1989)
Phys. Rev. B
, vol.40
, pp. 5484
-
-
-
11
-
-
2842521314
-
-
C. S. Nichols, C. G. Van de Walle, and S.T. Pantelides, Phys. Rev. Lett. 62, 1049 (1989); Phys. Rev. B 40, 5484 (1989); J. Zhu et al., Phys. Rev. B 54, 4741 (1996); J. Zhu, Comput. Mater. Sci. 12, 309 (1998).
-
(1996)
Phys. Rev. B
, vol.54
, pp. 4741
-
-
Zhu, J.1
-
12
-
-
0000971763
-
-
C. S. Nichols, C. G. Van de Walle, and S.T. Pantelides, Phys. Rev. Lett. 62, 1049 (1989); Phys. Rev. B 40, 5484 (1989); J. Zhu et al., Phys. Rev. B 54, 4741 (1996); J. Zhu, Comput. Mater. Sci. 12, 309 (1998).
-
(1998)
Comput. Mater. Sci.
, vol.12
, pp. 309
-
-
Zhu, J.1
-
13
-
-
0001739179
-
-
B. Sadigh, T. J. Lenosky, S. K. Theiss, M.-J. Caturla, T. Diaz de la Rubia, and M. A. Foad, Phys. Rev. Lett. 83, 4341 (1999).
-
(1999)
Phys. Rev. Lett.
, vol.83
, pp. 4341
-
-
Sadigh, B.1
Lenosky, T.J.2
Theiss, S.K.3
Caturla, M.-J.4
De La Rubia, T.D.5
Foad, M.A.6
-
14
-
-
0000065634
-
-
W. Windl, M. M. Bunea, R. Stumpf, S. T. Dunham, and M. P. Masquelier, Phys. Rev. Lett. 83, 4345 (1999).
-
(1999)
Phys. Rev. Lett.
, vol.83
, pp. 4345
-
-
Windl, W.1
Bunea, M.M.2
Stumpf, R.3
Dunham, S.T.4
Masquelier, M.P.5
-
15
-
-
0035881399
-
-
P. Alippi, L. Colombo, P. Ruggerone, A. Sieck, G. Seifert, and Th. Frauenheim, Phys. Rev. B 64, 075207 (2001).
-
(2001)
Phys. Rev. B
, vol.64
, pp. 075207
-
-
Alippi, P.1
Colombo, L.2
Ruggerone, P.3
Sieck, A.4
Seifert, G.5
Frauenheim, Th.6
-
18
-
-
0003776074
-
-
Wiley, New York
-
A. Benninghoven, F. G. Rüdenauer, and H.W. Werner, Secondary Ion Mass Spectrometry (Wiley, New York, 1987).
-
Secondary Ion Mass Spectrometry
, pp. 1987
-
-
Benninghoven, A.1
Rüdenauer, F.G.2
Werner, H.W.3
-
19
-
-
4344703750
-
-
edited by D. Briggs and M. P. Seah Wiley, Chichester, 2nd ed
-
M. G. Dowsett and E. A. Clark, in Practical Surface Analysis, edited by D. Briggs and M. P. Seah (Wiley, Chichester, 1992), 2nd ed., Vol. 2, pp. 234-240.
-
(1992)
Practical Surface Analysis
, vol.2
, pp. 234-240
-
-
Dowsett, M.G.1
Clark, E.A.2
-
20
-
-
3342986580
-
-
N. E. B. Cowern et al., Phys. Rev. Lett. 82, 4460 (1999); S. Solmi et al., Appl. Phys. Lett. 79, 1103 (2001).
-
(1999)
Phys. Rev. Lett.
, vol.82
, pp. 4460
-
-
Cowern, N.E.B.1
-
21
-
-
0035920880
-
-
N. E. B. Cowern et al., Phys. Rev. Lett. 82, 4460 (1999); S. Solmi et al., Appl. Phys. Lett. 79, 1103 (2001).
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 1103
-
-
Solmi, S.1
-
22
-
-
4344625183
-
-
note
-
s and is no more available for a further diffusion step. Indeed, reaction (2) would produce negligible corrections to the simulation profiles under the single flip approximation gt ≪ 1, where t is the total time, always satisfied in the present analysis.
-
-
-
-
24
-
-
0013269535
-
-
edited by R. Hull INSPEC, London
-
G. D. Watkins, in Properties of Crystalline Silicon, edited by R. Hull (INSPEC, London, 1999), p. 643; E.G. Svensson, ibid, p. 763; J. Adey, R. Jones, and P. R. Briddon, Appl. Phys. Lett. 83, 665 (2003).
-
(1999)
Properties of Crystalline Silicon
, pp. 643
-
-
Watkins, G.D.1
-
25
-
-
0346150774
-
-
G. D. Watkins, in Properties of Crystalline Silicon, edited by R. Hull (INSPEC, London, 1999), p. 643; E.G. Svensson, ibid, p. 763; J. Adey, R. Jones, and P. R. Briddon, Appl. Phys. Lett. 83, 665 (2003).
-
Properties of Crystalline Silicon
, pp. 763
-
-
Svensson, E.G.1
-
26
-
-
0043014836
-
-
G. D. Watkins, in Properties of Crystalline Silicon, edited by R. Hull (INSPEC, London, 1999), p. 643; E.G. Svensson, ibid, p. 763; J. Adey, R. Jones, and P. R. Briddon, Appl. Phys. Lett. 83, 665 (2003).
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 665
-
-
Adey, J.1
Jones, R.2
Briddon, P.R.3
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