메뉴 건너뛰기




Volumn 8, Issue 9, 2009, Pages 752-757

Linking a completely three-dimensional nanostrain toa structural transformation eigenstrain

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LATTICE MISMATCH; MARTENSITIC TRANSFORMATIONS; NICKEL; PRECIPITATES; SHAPE MEMORY EFFECT; TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 69249205400     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat2488     Document Type: Article
Times cited : (96)

References (29)
  • 1
    • 19944433396 scopus 로고    scopus 로고
    • Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors
    • Lee, M. L., Fitzgerald, E. A., Bulsa, M. T., Currie, M. T. & Lochtefeld, A. J. Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors. Appl. Phys. 97, 011101 (2005).
    • (2005) Appl. Phys , vol.97 , pp. 011101
    • Lee, M.L.1    Fitzgerald, E.A.2    Bulsa, M.T.3    Currie, M.T.4    Lochtefeld, A.J.5
  • 2
    • 33748575889 scopus 로고    scopus 로고
    • Continuous MOSFET performance increase with device scaling: The role of strain and channel material innovations
    • Antoniadis, D. A. et al. Continuous MOSFET performance increase with device scaling: The role of strain and channel material innovations. IBM J. Res. Dev. 50, 363-376 (2006).
    • (2006) IBM J. Res. Dev , vol.50 , pp. 363-376
    • Antoniadis, D.A.1
  • 3
    • 33750148553 scopus 로고    scopus 로고
    • Direct strain measurement in a 65nm node strained silicon transistor by convergent-beam electron diffraction
    • Zhang, P. et al. Direct strain measurement in a 65nm node strained silicon transistor by convergent-beam electron diffraction. Appl. Phys. 89, 161907 (2006).
    • (2006) Appl. Phys , vol.89 , pp. 161907
    • Zhang, P.1
  • 5
    • 0037519622 scopus 로고    scopus 로고
    • Quantitative measurement of displacement and strain fields from HRTEM micrographs
    • Ḩtch, M. J., Snoeck, E. & Kilaas, R. Quantitative measurement of displacement and strain fields from HRTEM micrographs. Ultramicroscopy 57, 131-146 (1998).
    • (1998) Ultramicroscopy , vol.57 , pp. 131-146
    • Ḩtch, M.J.1    Snoeck, E.2    Kilaas, R.3
  • 6
    • 27744496180 scopus 로고    scopus 로고
    • Theoretical discussions on the geometrical phase analysis
    • Rouvière, J. L. & Sigiannidou, E. Theoretical discussions on the geometrical phase analysis. Ultramicroscopy 106, 1-17 (2005).
    • (2005) Ultramicroscopy , vol.106 , pp. 1-17
    • Rouvière, J.L.1    Sigiannidou, E.2
  • 7
    • 5444247603 scopus 로고    scopus 로고
    • Measurement of the displacement field of dislocations to 0.03 angstrom by electron microscopy
    • Ḩtch, M. J., Putaux, J. L. & Penisson, J. M. Measurement of the displacement field of dislocations to 0.03 angstrom by electron microscopy. Nature 423, 270-273 (2003).
    • (2003) Nature , vol.423 , pp. 270-273
    • Ḩtch, M.J.1    Putaux, J.L.2    Penisson, J.M.3
  • 8
    • 38549093243 scopus 로고    scopus 로고
    • Effects of elastic anisotropy on strain distributions in decahedral gold nanopticles
    • Johnson, C. L. et al. Effects of elastic anisotropy on strain distributions in decahedral gold nanopticles. Nature Mater. 7, 120-124 (2008).
    • (2008) Nature Mater , vol.7 , pp. 120-124
    • Johnson, C.L.1
  • 9
    • 42449161474 scopus 로고    scopus 로고
    • Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy
    • Hue, F., Hytch, M., Bender, H., Houdellier, F. & Claverie, A. Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy. Phys. Rev. Lett. 100, 156602 (2008).
    • (2008) Phys. Rev. Lett , vol.100 , pp. 156602
    • Hue, F.1    Hytch, M.2    Bender, H.3    Houdellier, F.4    Claverie, A.5
  • 10
    • 0001583016 scopus 로고
    • Strained state of Ge(Si) islands on Si: Finite element calculations and compison to convergent beam electron-diffraction measurements
    • Christiansen, S., Albrecht, M., Strunk, H. P. & Maier, H. J. Strained state of Ge(Si) islands on Si: Finite element calculations and compison to convergent beam electron-diffraction measurements. Appl. Phys. Lett. 64, 3617-3618 (1994).
    • (1994) Appl. Phys. Lett , vol.64 , pp. 3617-3618
    • Christiansen, S.1    Albrecht, M.2    Strunk, H.P.3    Maier, H.J.4
  • 11
    • 0037048566 scopus 로고    scopus 로고
    • 3-precipitation during ageing of NiTi shape memory alloys and its influence on mtensitic phase transformations
    • 3-precipitation during ageing of NiTi shape memory alloys and its influence on mtensitic phase transformations. Acta Mater. 50, 4255-4274 (2002).
    • (2002) Acta Mater , vol.50 , pp. 4255-4274
    • Khalil-Allafi, J.1    Dlouhy, A.2    Eggeler, G.3
  • 12
    • 51649147951 scopus 로고
    • Precipitation processes in ne equiatomic TiNi shape memory alloys
    • Nishida, M., Wayman, C. M. & Honma, T. Precipitation processes in ne equiatomic TiNi shape memory alloys. Metall. Trans. A 17A, 1505-1515 (1986).
    • (1986) Metall. Trans. A , vol.17 A , pp. 1505-1515
    • Nishida, M.1    Wayman, C.M.2    Honma, T.3
  • 13
    • 0022795898 scopus 로고
    • Crystal structure, composition and morphology of a precipitate in an aged Ti-51 at%Ni shape memory alloy
    • Tadaki, T., Nakata, Y., Shimizu, K. & Otsuka, K. Crystal structure, composition and morphology of a precipitate in an aged Ti-51 at%Ni shape memory alloy. Trans. Japan Inst. Met. 27, 731-740 (1986).
    • (1986) Trans. Japan Inst. Met , vol.27 , pp. 731-740
    • Tadaki, T.1    Nakata, Y.2    Shimizu, K.3    Otsuka, K.4
  • 15
    • 0032147789 scopus 로고    scopus 로고
    • Interaction between microstructure and multiple-step transformation in biny NiTi alloys using in situ transmission electron microscopy observations
    • Batailld, L., Bidaux, J.-E. & Gotthdt, R. Interaction between microstructure and multiple-step transformation in biny NiTi alloys using in situ transmission electron microscopy observations. Phil. Mag. A 78, 327-344 (1998).
    • (1998) Phil. Mag. A , vol.78 , pp. 327-344
    • Batailld, L.1    Bidaux, J.-E.2    Gotthdt, R.3
  • 16
    • 0142228629 scopus 로고    scopus 로고
    • Multiple-step mtensitic transformations in Ni-rich NiTi shape memory alloys
    • Croll, M. C., Somsen, Ch. & Eggeler, G. Multiple-step mtensitic transformations in Ni-rich NiTi shape memory alloys. Scr. Mater. 50, 187-192 (2004).
    • (2004) Scr. Mater , vol.50 , pp. 187-192
    • Croll, M.C.1    Somsen, C.2    Eggeler, G.3
  • 17
    • 3242737733 scopus 로고    scopus 로고
    • Origin of abnormal multi-stage mtensitic transformation behaviour in aged Ni-rich Ti-Ni shape memory alloys
    • Fan, G. et al. Origin of abnormal multi-stage mtensitic transformation behaviour in aged Ni-rich Ti-Ni shape memory alloys. Acta Mater. 52, 4351-4362 (2004).
    • (2004) Acta Mater , vol.52 , pp. 4351-4362
    • Fan, G.1
  • 20
    • 0142190060 scopus 로고    scopus 로고
    • Multiple-step mtensitic transformations in Ni-rich NiTi alloys-an in situ transmission electron microscopy investigation
    • Dlouhy, A., Khalil-Allafi, J. & Eggeler, G. Multiple-step mtensitic transformations in Ni-rich NiTi alloys-an in situ transmission electron microscopy investigation. Phil. Mag. A 3, 339-364 (2003).
    • (2003) Phil. Mag. A , vol.3 , pp. 339-364
    • Dlouhy, A.1    Khalil-Allafi, J.2    Eggeler, G.3
  • 23
    • 0020204199 scopus 로고
    • Direct interpretation of high resolution electron images of substitutional alloy systems with a column structure
    • Van Dyck, D., Van Tendeloo, G. & Amelinckx, S. Direct interpretation of high resolution electron images of substitutional alloy systems with a column structure. Ultramicroscopy 10, 263-280 (1982).
    • (1982) Ultramicroscopy , vol.10 , pp. 263-280
    • Van Dyck, D.1    Van Tendeloo, G.2    Amelinckx, S.3
  • 24
    • 0032762550 scopus 로고    scopus 로고
    • The influence of ageing on critical transformation stress levels and mtensite stt temperatures in NiTi: Pt I-aged microstructure and micro-mechanical modelling
    • Gall, K., Sehitoglu, H., Chumlyakov, Y. I., Kireeva, I. V. & Maier, H. J. The influence of ageing on critical transformation stress levels and mtensite stt temperatures in NiTi: Pt I-aged microstructure and micro-mechanical modelling. J. Eng. Mater. Tech. 121, 19-27 (1999).
    • (1999) J. Eng. Mater. Tech , vol.121 , pp. 19-27
    • Gall, K.1    Sehitoglu, H.2    Chumlyakov, Y.I.3    Kireeva, I.V.4    Maier, H.J.5
  • 25
    • 3042777966 scopus 로고    scopus 로고
    • The influence of temperature on lattice pameters of coexisting phases in NiTi shape memory alloys-a neutron diffraction study
    • Khalil-Allafi, J. et al. The influence of temperature on lattice pameters of coexisting phases in NiTi shape memory alloys-a neutron diffraction study. Mater. Sci. Eng. A 378, 161-164 (2004).
    • (2004) Mater. Sci. Eng. A , vol.378 , pp. 161-164
    • Khalil-Allafi, J.1
  • 27
    • 0036417291 scopus 로고    scopus 로고
    • High-resolution electron microscopy and electron tomography: Resolution versus precision
    • Van Aert, S., den Dekker, A. J., Van Dyck, D. & van den Bos, A. High-resolution electron microscopy and electron tomography: Resolution versus precision. J. Struct. Biol. 138, 21-33 (2002).
    • (2002) J. Struct. Biol , vol.138 , pp. 21-33
    • Van Aert, S.1    den Dekker, A.J.2    Van Dyck, D.3    van den Bos, A.4
  • 28
    • 37849022363 scopus 로고    scopus 로고
    • Electron energy-loss spectroscopy and first-principles calculation studies on a Ni-Ti shape memory alloy
    • Yang, Z., Tirry, W., Lamoen, D., Kulkova, S. & Schryvers, D. Electron energy-loss spectroscopy and first-principles calculation studies on a Ni-Ti shape memory alloy. Acta Mater. 56, 395-404 (2008).
    • (2008) Acta Mater , vol.56 , pp. 395-404
    • Yang, Z.1    Tirry, W.2    Lamoen, D.3    Kulkova, S.4    Schryvers, D.5
  • 29
    • 15344340320 scopus 로고    scopus 로고
    • 3precipitates in Ni-Ti shape memory material. Scr. Mater. 52, 1129-1134 (2005). 30 Šittner, P., Landa, M., Lukáš , P. & Novák, V. R-phase transformation phenomena in thermomechanically loaded NiTi polycrystals. Mech. Mater. 38, 475-492 (2006).
    • 3precipitates in Ni-Ti shape memory material. Scr. Mater. 52, 1129-1134 (2005). 30 Šittner, P., Landa, M., Lukáš , P. & Novák, V. R-phase transformation phenomena in thermomechanically loaded NiTi polycrystals. Mech. Mater. 38, 475-492 (2006).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.