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Volumn 95, Issue 21, 2005, Pages

Direct evidence of nanometric invasionlike grain boundary penetration in the Al/Ga system

Author keywords

[No Author keywords available]

Indexed keywords

INTERGRANULAR LIQUID LAYERS; STRESS LEVELS; SYNCHROTRON PROJECTION MICROSCOPY;

EID: 28844468789     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.215501     Document Type: Article
Times cited : (49)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.