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Volumn 106, Issue 3, 2009, Pages

Dispersive capacitance and conductance across the phase transition boundary in metal-vanadium oxide-silicon devices

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; DEVICE STRUCTURES; ELECTRONIC DEVICE; FREQUENCY DEPENDENCE; FREQUENCY-DEPENDENT; FUNCTIONAL OXIDES; INSULATING STATE; LOW FREQUENCY; METALLIC STATE; PHASE-TRANSITION BOUNDARY; POWER-LAW BEHAVIOR; SEMICONDUCTOR CAPACITORS; SILICON DEVICES; TUNABILITIES; VANADIUM OXIDE THIN FILMS; VANADIUM OXIDES;

EID: 69149088688     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3186024     Document Type: Article
Times cited : (15)

References (45)
  • 1
    • 4244014869 scopus 로고
    • 0031-9007,. 10.1103/PhysRevLett.3.34
    • F. J. Morin, Phys. Rev. Lett. 0031-9007 3, 34 (1959). 10.1103/PhysRevLett.3.34
    • (1959) Phys. Rev. Lett. , vol.3 , pp. 34
    • Morin, F.J.1
  • 3
    • 0000531283 scopus 로고
    • 0038-1098,. 10.1016/0038-1098(69)90888-6
    • L. A. Ladd and W. Paul, Solid State Commun. 0038-1098 7, 425 (1969). 10.1016/0038-1098(69)90888-6
    • (1969) Solid State Commun. , vol.7 , pp. 425
    • Ladd, L.A.1    Paul, W.2
  • 5
    • 36049053404 scopus 로고
    • 0034-6861,. 10.1103/RevModPhys.40.677
    • N. F. Mott, Rev. Mod. Phys. 0034-6861 40, 677 (1968). 10.1103/RevModPhys.40.677
    • (1968) Rev. Mod. Phys. , vol.40 , pp. 677
    • Mott, N.F.1
  • 6
    • 0001532854 scopus 로고
    • 0022-4596,. 10.1016/0022-4596(71)90091-0
    • J. B. Goodenough, J. Solid State Chem. 0022-4596 3, 490 (1971). 10.1016/0022-4596(71)90091-0
    • (1971) J. Solid State Chem. , vol.3 , pp. 490
    • Goodenough, J.B.1
  • 9
    • 55249088300 scopus 로고    scopus 로고
    • 0021-8979,. 10.1063/1.3000664
    • C. Ko and S. Ramanathan, J. Appl. Phys. 0021-8979 104, 086105 (2008). 10.1063/1.3000664
    • (2008) J. Appl. Phys. , vol.104 , pp. 086105
    • Ko, C.1    Ramanathan, S.2
  • 10
    • 27744597738 scopus 로고    scopus 로고
    • 0921-4526,. 10.1016/j.physb.2005.07.032
    • B. G. Chae, H. T. Kim, D. H. Youn, and K. Y. Kang, Physica B 0921-4526 369, 76 (2005). 10.1016/j.physb.2005.07.032
    • (2005) Physica B , vol.369 , pp. 76
    • Chae, B.G.1    Kim, H.T.2    Youn, D.H.3    Kang, K.Y.4
  • 21
    • 0142026444 scopus 로고    scopus 로고
    • 0003-6951,. 10.1063/1.1613036
    • J. Lu and S. Stemmer, Appl. Phys. Lett. 0003-6951 83, 2411 (2003). 10.1063/1.1613036
    • (2003) Appl. Phys. Lett. , vol.83 , pp. 2411
    • Lu, J.1    Stemmer, S.2
  • 22
    • 21444434406 scopus 로고    scopus 로고
    • Microwave dielectric properties of tunable capacitors employing bismuth zinc niobate thin films
    • DOI 10.1063/1.1883306, 084110
    • J. Park, J. Lu, S. Stemmer, and R. A. York, J. Appl. Phys. 0021-8979 97, 084110 (2005). 10.1063/1.1883306 (Pubitemid 40914250)
    • (2005) Journal of Applied Physics , vol.97 , Issue.8 , pp. 1-4
    • Park, J.1    Lu, J.2    Stemmer, S.3    York, R.A.4
  • 24
    • 0034188340 scopus 로고    scopus 로고
    • 2 thin films and examination with MIS-elements and C-V-measurements
    • DOI 10.1016/S0040-6090(00)00711-2
    • H. J. Schlag and W. Scherber, Thin Solid Films 0040-6090 366, 28 (2000). 10.1016/S0040-6090(00)00711-2 (Pubitemid 30867690)
    • (2000) Thin Solid Films , vol.366 , Issue.1-2 , pp. 28-31
    • Schlag, H.J.1    Scherber, W.2
  • 25
    • 0035498282 scopus 로고    scopus 로고
    • Effect of the metal-semiconductor phase transition on the capacitance of an aluminum-dielectric-vanadium dioxide heterostructure
    • DOI 10.1134/1.1424394
    • A. A. Bugaev, S. E. Nikitin, and E. I. Terukov, Tech. Phys. Lett. 1063-7850 27, 924 (2001). 10.1134/1.1424394 (Pubitemid 33394068)
    • (2001) Technical Physics Letters , vol.27 , Issue.11 , pp. 924-925
    • Bugaev, A.A.1    Nikitin, S.E.2    Terukov, E.I.3
  • 27
    • 58149149491 scopus 로고    scopus 로고
    • 0003-6951,. 10.1063/1.3050464
    • C. Ko and S. Ramanathan, Appl. Phys. Lett. 0003-6951 93, 252101 (2008). 10.1063/1.3050464
    • (2008) Appl. Phys. Lett. , vol.93 , pp. 252101
    • Ko, C.1    Ramanathan, S.2
  • 28
    • 69149094196 scopus 로고    scopus 로고
    • JCPDS Card No. 01-082-0661.
    • JCPDS Card No. 01-082-0661.
  • 29
    • 69149089531 scopus 로고    scopus 로고
    • JCPDS Card No. 00-046-1043.
    • JCPDS Card No. 00-046-1043.
  • 32
    • 33845214529 scopus 로고    scopus 로고
    • Phase transition and critical issues in structure-property correlations of vanadium oxide
    • DOI 10.1063/1.2384798
    • J. Narayan and V. M. Bhosle, J. Appl. Phys. 0021-8979 100, 103524 (2006). 10.1063/1.2384798 (Pubitemid 44853669)
    • (2006) Journal of Applied Physics , vol.100 , Issue.10 , pp. 103524
    • Narayan, J.1    Bhosle, V.M.2
  • 33
    • 0017382315 scopus 로고
    • 0028-0836,. 10.1038/267673a0
    • A. K. Jonscher, Nature (London) 0028-0836 267, 673 (1977). 10.1038/267673a0
    • (1977) Nature (London) , vol.267 , pp. 673
    • Jonscher, A.K.1
  • 35
    • 0032690319 scopus 로고    scopus 로고
    • 0022-3727,. 10.1088/0022-3727/32/14/201
    • A. K. Jonscher, J. Phys. D 0022-3727 32, R57 (1999). 10.1088/0022-3727/ 32/14/201
    • (1999) J. Phys. D , vol.32 , pp. 57
    • Jonscher, A.K.1
  • 39
    • 0001994375 scopus 로고
    • 0031-8914,. 10.1016/0031-8914(60)90115-4
    • L. K. H. van Beek, Physica (Amsterdam) 0031-8914 26, 66 (1960). 10.1016/0031-8914(60)90115-4
    • (1960) Physica (Amsterdam) , vol.26 , pp. 66
    • Van Beek, L.K.H.1
  • 43


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.