Stability of electrical switching properties in vanadium dioxide thin films under multiple thermal cycles across the phase transition boundary

Journal of Applied Physics

Volumn 104, Issue 8, 2008, Pages

  Ko, Changhyun ^a   Ramanathan, Shriram ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTICITY; HYSTERESIS; METAL INSULATOR BOUNDARIES; PHASE STABILITY; PHASE TRANSITIONS; REACTIVE SPUTTERING; SEMICONDUCTOR INSULATOR BOUNDARIES; SOLIDS; STOICHIOMETRY; THICK FILMS; THIN FILMS; TRANSITION METALS; VANADIUM; VANADIUM ALLOYS; VANADIUM COMPOUNDS;

COOLING CYCLES; ELECTRICAL SWITCHING PROPERTIES; ELECTRICAL TRANSITIONS; FILM TEXTURES; HIGH QUALITIES; NO REDUCTIONS; ONSET TEMPERATURES; RESISTIVITY RATIOS; SENSING ELEMENTS; SOLID STATES; STRUCTURAL STUDIES; TRANSITION BOUNDARIES; VANADIUM DIOXIDE THIN FILMS; VANADIUM DIOXIDES; VANADIUM OXIDES; VO2 THIN FILMS;

METAL INSULATOR TRANSITION;

EID: 55249088300     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3000664     Document Type: Article

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