Structure-functional property relationships in rf-sputtered vanadium dioxide thin films

Journal of Applied Physics

Volumn 102, Issue 11, 2007, Pages

  Ruzmetov, Dmitry ^a   Zawilski, Kevin T ^b   Narayanamurti, Venkatesh ^a   Ramanathan, Shriram ^a  

^a HARVARD UNIVERSITY   (United States)

^b BAE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

REACTIVE SPUTTERING; REFLECTION; SYNTHESIS (CHEMICAL); VANADIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

INFRARED OPTICAL REFLECTANCE MEASUREMENTS; METAL-INSULATOR TRANSITION (MIT); VANADIUM DIOXIDE THIN FILMS;

THIN FILMS;

EID: 37249013020     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2817818     Document Type: Article

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