SCOPUS 정보 검색 플랫폼

Volumn 103, Issue 6, 2009, Pages

X-ray nanointerferometer based on Si refractive bilenses

(9) Snigirev, A a Snigireva, I a Kohn, V b Yunkin, V c Kuznetsov, S c Grigoriev, M B c Roth, T a Vaughan, G a Detlefs, C a

a EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

b KURCHATOV INSTITUTE (Russian Federation)

c INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT BEAMS; COHERENT ILLUMINATION; COMPOUND REFRACTIVE LENS; DIFFRACTION-LIMITED BEAMS; FAR FIELD INTERFERENCE; FRINGE SPACING; INTERFERENCE FIELD; NANO-SCALE MATERIALS; NEW OPPORTUNITIES; SUBMICRON; X-RAY COHERENCE; X-RAY INTERFEROMETERS;

EID: 68649096408 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.103.064801 Document Type: Article

Times cited : (75)

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