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Optics Communications

Volumn 191, Issue 1-2, 2001, Pages 91-96

Interferometric measurements with hard X-rays using a double slit

(3) Leitenberger, W a,c Kuznetsov, S M b Snigirev, A a

a EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

b INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS (Russian Federation)

c LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH (Germany)

Author keywords

Coherence; Diffraction; Hard X rays; Interferometry; Synchrotron radiation

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; SYNCHROTRON RADIATION; X RAYS;

DOUBLE SLIT INTERFEROMETERS; INTERFERENCE PATTERNS;

INTERFEROMETRY;

EID: 0035341853 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/S0030-4018(01)01104-X Document Type: Article

Times cited : (44)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.