Fault modeling and functional test methods for digital microfluidic biochips

IEEE Transactions on Biomedical Circuits and Systems

Volumn 3, Issue 4, 2009, Pages 241-253

  Xu, Tao ^a   Chakrabarty, Krishnendu ^b  

^a CISCO SYSTEMS   (United States)

^b Duke University   (United States)

Author keywords

Dependability; Lab on chip; Microfluidics; Reconfiguration; Testing

Indexed keywords

CAPACITIVE SENSING; DEFECT SITES; DEPENDABILITY; DIGITAL MICROFLUIDIC BIOCHIPS; ELECTRODE DEGRADATION; FAULT MODELING; FUNCTIONAL TEST; FUNCTIONAL TESTING; FUNCTIONAL UNITS; HEALTH ASSESSMENTS; LAB-ON-CHIP; MICRO FLUIDIC BIOCHIPS; MICROFLUIDIC ARRAY; POINT OF CARE; QUALITY MONITORING; RECONFIGURATION; SAFETY CRITICAL APPLICATIONS; TEST METHOD;

BIOASSAY; DROP FORMATION; FLUIDIC LOGIC DEVICES; MICROFLUIDICS; SAFETY TESTING;

BIOCHIPS;

EID: 68449087341     PISSN: 19324545     EISSN: None     Source Type: Journal    
DOI: 10.1109/TBCAS.2009.2022173     Document Type: Conference Paper

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