Pseudorandom functional BIST for linear and nonlinear MEMS

Proceedings -Design, Automation and Test in Europe, DATE

Volumn 1, Issue , 2006, Pages

  Dhayni, A ^a   Mir, S ^a   Rufer, L ^a   Bounceur, A ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; FAILURE ANALYSIS; FUNCTIONAL ANALYSIS; IMPULSE RESPONSE; NONLINEAR NETWORK SYNTHESIS; RANDOM PROCESSES;

DEVICE UNDER TEST (DUT); INVERSE-REPEAT SEQUENCE (IRS); LINEAR TIME INVARIANT (LTI); MAXIMAL LENGTH SEQUENCE (MLS); VOLTERRA KERNELS;

MEMS;

EID: 34047185395     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2006.244039     Document Type: Conference Paper

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