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Volumn 19, Issue 5, 2009, Pages

A mechanical de-tethering technique for silicon MEMS etched with a DRIE process

Author keywords

[No Author keywords available]

Indexed keywords

DIMENSIONAL RULES; DRIE PROCESS; FABRICATION PROCESS; MECHANICAL FORCE; MICRO ASSEMBLY; MICROELECTROMECHANICAL SYSTEMS; NEW SOLUTIONS; SILICON MEMS; SPECIAL MACHINE; WAFER DICING;

EID: 68249141867     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/19/5/055011     Document Type: Article
Times cited : (14)

References (17)
  • 1
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    • Fabrication of MEMS devices by using anhydrous HF gas-phase etching with alcoholic vapor
    • Jang W, Choi C, Lee M, Jun C and Kim Y 2002 Fabrication of MEMS devices by using anhydrous HF gas-phase etching with alcoholic vapor J. Micromech. Microeng. 12 297-306
    • (2002) J. Micromech. Microeng. , vol.12 , pp. 297-306
    • Jang., W.1    Choi, C.2    Lee, M.3    Jun, C.4    Kim, Y.5
  • 2
    • 0036448850 scopus 로고    scopus 로고
    • Microfabrication and scale effect studies for a magnetic micromanipulation system
    • Gauthier M and Piat E 2002 Microfabrication and scale effect studies for a magnetic micromanipulation system Proc. of the IEEE Int. Conf. on Intelligent Robots and Systems (Lausanne, Switzerland 2002) vol 2 pp 1754-59
    • (2002) Proc. of the IEEE Int. Conf. on Intelligent Robots and Systems , vol.2 , pp. 1754-1759
    • Gauthier, M.1    Piat, E.2
  • 3
    • 0031221264 scopus 로고    scopus 로고
    • A new sacrificial layer process for the fabrication of micromechanical systems
    • Cuiy Z and Lawes R A 1997 A new sacrificial layer process for the fabrication of micromechanical systems J. Micromech. Microeng. 7 128-30
    • (1997) J. Micromech. Microeng. , vol.7 , pp. 128-130
    • Cuiy, Z.1    Lawes, R.A.2
  • 10
    • 84904463919 scopus 로고    scopus 로고
    • Critical aspect ratio dependence in deep reactive ion etching of silicon
    • Yeom J, Wu Y and Shannon M A 2003 Critical aspect ratio dependence in deep reactive ion etching of silicon Proc. 2003 IEEE Int. Conf. on Transducers (Solid-State Sensors, Actuators and Microsystems vol 2) pp 1631-4
    • (2003) Proc. 2003 IEEE Int. Conf. on Transducers , pp. 1631-1634
    • Yeom, J.1    Wu, Y.2    Shannon, M.A.3
  • 11
    • 33846484842 scopus 로고    scopus 로고
    • Hole-type two-dimensional photonic crystal fabricated in silicon on insulator wafers
    • Teo S H G, Liu A Q, Singh J and Yu B M 2007 Hole-type two-dimensional photonic crystal fabricated in silicon on insulator wafers Sensors Actuators A 133 388-94
    • (2007) Sensors Actuators , vol.133 , pp. 388-394
    • Teo, S.H.G.1    Liu, A.Q.2    Singh, J.3    Yu, B.M.4
  • 12
    • 0039526381 scopus 로고
    • Evaluation of elastic fracture mechanics parameters for bend specimens
    • Bakker A D 1995 Evaluation of elastic fracture mechanics parameters for bend specimens Int. J. Fracture 71 323-43
    • (1995) Int. J. Fracture , vol.71 , pp. 323-343
    • Bakker, A.D.1
  • 15
    • 0032314307 scopus 로고    scopus 로고
    • Stress intensity factor, compliance and CMOD for a general three-point-bend beam
    • Guinea G V, Pastor J Y, Planas J and Elices M 1998 Stress intensity factor, compliance and CMOD for a general three-point-bend beam Int. J. Fracture 89 103-16
    • (1998) Int. J. Fracture , vol.89 , pp. 103-116
    • Guinea, G.V.1    Pastor, J.Y.2    Planas, J.3    Elices, M.4
  • 16
    • 0033749884 scopus 로고    scopus 로고
    • Fracture toughness and crack growth phenomena of plasma-etched single crystal silicon
    • Fitzgerald A M, Dauskardt R H and Kenny T W 2000 Fracture toughness and crack growth phenomena of plasma-etched single crystal silicon Sensors Actuators 83 194-9
    • (2000) Sensors Actuators , vol.83 , pp. 194-199
    • Fitzgerald, A.M.1    Dauskardt, R.H.2    Kenny, T.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.