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Volumn 65, Issue 7, 2009, Pages 672-678

Introducing robustness to maximum-likelihood refinement of electron-microsopy data

Author keywords

Electron microscopy; Expectation maximization algorithm; Maximum likelihood refinement; Robustness

Indexed keywords

ELONGATION FACTOR G;

EID: 68149159867     PISSN: 09074449     EISSN: 13990047     Source Type: Journal    
DOI: 10.1107/S0907444909012049     Document Type: Article
Times cited : (6)

References (36)
  • 36


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.